Frontiers of Thin Film Technology - 1st Edition - ISBN: 9780125330282, 9780080542942

Frontiers of Thin Film Technology, Volume 28

1st Edition

Serial Volume Editors: Maurice Francombe
Serial Editors: Stephen Rossnagel Abraham Ulman
eBook ISBN: 9780080542942
Imprint: Academic Press
Published Date: 27th October 2000
Page Count: 476
Tax/VAT will be calculated at check-out Price includes VAT (GST)
20% off
20% off
20% off
20% off
25200.00
20160.00
180.00
144.00
235.00
188.00
145.00
116.00
Unavailable
Price includes VAT (GST)
DRM-Free

Easy - Download and start reading immediately. There’s no activation process to access eBooks; all eBooks are fully searchable, and enabled for copying, pasting, and printing.

Flexible - Read on multiple operating systems and devices. Easily read eBooks on smart phones, computers, or any eBook readers, including Kindle.

Open - Buy once, receive and download all available eBook formats, including PDF, EPUB, and Mobi (for Kindle).

Institutional Access

Secure Checkout

Personal information is secured with SSL technology.

Free Shipping

Free global shipping
No minimum order.

Description

Frontiers of Thin Film Technology, Volume 28 focuses on recent developments in those technologies that are critical to the successful growth, fabrication, and characterization of newly emerging solid-state thin film device architectures.

Volume 28 is a condensed sampler of the Handbook for use by professional scientists, engineers, and students involved in the materials, design, fabrication, diagnostics, and measurement aspects of these important new devices.

Readership

Thin film and surface science researchers in chemistry, materials science, electrical engineering, biology, and condensed matter physics.


Details

No. of pages:
476
Language:
English
Copyright:
© Academic Press 2001
Published:
Imprint:
Academic Press
eBook ISBN:
9780080542942

About the Serial Volume Editors

Maurice Francombe Serial Volume Editor

Affiliations and Expertise

Georgia State University, Atlanta, U.S.A.

About the Serial Editors

Stephen Rossnagel Serial Editor

Affiliations and Expertise

IBM Corporation, T.J. Watson Research Center, Yorktown Heights, New York, U.S.A.

Abraham Ulman Serial Editor

Affiliations and Expertise

Polytechnic University, Brooklyn, New York, U.S.A.