ESD Protection Methodologies

ESD Protection Methodologies

From Component to System

1st Edition - July 21, 2017
This is the Latest Edition
  • Authors: Marise Bafleur, Fabrice Caignet, Nicolas Nolhier
  • eBook ISBN: 9780081011607
  • Hardcover ISBN: 9781785481222

Purchase options

Purchase options
DRM-free (PDF, Mobi, EPub)
Available
Sales tax will be calculated at check-out

Institutional Subscription

Free Global Shipping
No minimum order

Description

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.

Key Features

  • Provides a global ESD protection approach from component to system, including both the proposal of investigation techniques and predictive simulation methodologies
  • Addresses circuit and system designers as well as failure analysis engineers
  • Provides the description of specifically developed investigation techniques and the application of the proposed methodologies to real case studies

Readership

Circuit and system designers and PhD students starting in the field; failure analysis engineers

Table of Contents

  • 1. ESD Standards: From Component to System
    2. Characterization Techniques
    3. Protection Strategies Against ESD 
    4. Modeling and Simulation Methods
    5. Case Studies

Product details

  • No. of pages: 284
  • Language: English
  • Copyright: © ISTE Press - Elsevier 2017
  • Published: July 21, 2017
  • Imprint: ISTE Press - Elsevier
  • eBook ISBN: 9780081011607
  • Hardcover ISBN: 9781785481222
  • About the Authors

    Marise Bafleur

    Marise Bafleur is Research Director at the Laboratory for Analysis and Architecture of Systems (LAAS-CNRS) in Toulouse, France.

    Affiliations and Expertise

    Laboratory for Analysis and Architecture of Systems (LAAS-CNRS), France

    Fabrice Caignet

    Fabrice Caignet is a Lecturer at Paul Sabatier University in Toulouse, France. .

    Affiliations and Expertise

    Paul Sabatier University, France

    Nicolas Nolhier

    Nicolas Nolhier is Professor in Electronics at Paul Sabatier University in Toulouse, France.

    Affiliations and Expertise

    Paul Sabatier University, France