
Embedded Mechatronic Systems 2
Analysis of Failures, Modeling, Simulation and Optimization
Description
Key Features
- Provides many detailed examples
- Develops a characterization methodology for faults in mechatronic systems
- Analyzes the multi-physical modeling of faults, revealing weaknesses in design and failure mechanisms
Readership
Table of Contents
1. Highly Accelerated Testing
Philippe Pougnet, Pierre Richard Dahoo and Jean-Loup Alvarez
2. Aging Power Transistors in Operational Conditions
Pascal Dherbecourt, Olivier Latry, Karine Dehais-Mourgues, Jean-Baptiste Fonder, Cédric Duperrier, Farid Temcamani, Hichame Maanane and Jean-Pierre Sipma
3. Physical Defects Analysis of Mechatronic Systems
Christian Gautier, Eric Pieraerts and Olivier Latry
4. Impact of Voids in Interconnection Materials
Pierre Richard Dahoo, Malika Khettab, Christian Chong, Armelle Girard and Philippe Pougnet.
5. Electro-Thermo-Mechanical Modeling
Abderahman Makhloufi, Younes Aoues and Abdelkhalak El Hami.
6. Meta-Model Development
Bouzid Ait-Amir, Philippe Pougnet and Abdelkhalak El Hami.
7. Optimizing Reliability of Electronic Systems
Younes Aoues, Abderahman Makhloufi and Abdelkhalak El Hami.
8. High-Efficiency Architecture for Power Amplifiers
Farid Temcamani, Jean-Baptiste Fonder, Cédric Duperrier and Olivier Latry
Product details
- No. of pages: 300
- Language: English
- Copyright: © ISTE Press - Elsevier 2020
- Published: February 28, 2020
- Imprint: ISTE Press - Elsevier
- Hardcover ISBN: 9781785481901
- eBook ISBN: 9780081019566
About the Editors
Abdelkhalak El Hami
Affiliations and Expertise
Philippe Pougnet
Affiliations and Expertise
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