Electron Probe Microanalysis - 1st Edition - ISBN: 9780120145669, 9781483284637

Electron Probe Microanalysis

1st Edition

Editors: A. J. Tousimis L. Marton
eBook ISBN: 9781483284637
Imprint: Academic Press
Published Date: 1st January 1969
Page Count: 462
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Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.

Table of Contents


List of Contributors


Survey of Microanalysis—Interpolation and Extrapolation



Behavior of Electrons in a Specimen

I. Introduction

II. Backscattering and Diffusion of Electrons

III. Spot Size of Diffused X-Ray Source and Depth Distribution of Characteristic X-Ray

IV. Resolving Power of Electron Microprobe

V. Application of Backscattered Electron and Specimen Current Methods


The Sandwich Sample Technique Applied to Quantitative Microprobe Analysis

I. Introduction

II. The Absorption Correction

III. Fluorescence Due to Characteristic Lines

IV. The Atomic Number Effect

V. A Model for Quantitative Electron Probe Microanalysis


Quantitative Microprobe Analysis: A Basis for Universal Atomic Number Correction Tables and Victor G. Macres

I. Introduction

II. Formulation of Atomic Number Correction

III. Discussion and Evaluation of the Correction Formula

IV. Basis for Universal Correction Tables

V. Application to Experimental Data

VI. Summary and Conclusions

Appendix I. Tabulation of λ' Values

Appendix II. Example Calculation Using Universal Atomic Number Correction Tables

Appendix III. Mass Absorption Coefficients

Appendix IV. Mass Absorption Coefficients


Deconvolution: A Technique to Increase Electron Probe Resolution


I. Introduction

II. Theory of the Deconvolution Method

III. Mathematics of the Deconvolution Method

IV. Experimental Measurements

V. Reduction of Data

VI. Discussion


Analysis for Low Atomic Number Elements with the Electron Microprobe

I. Introduction

II. The Stearate Crystal

III. Reduction of Carbon Contamination

IV. Analysis of the Light Elements


Changes in X-Ray Emission Spectra Observed between the Pure Elements and Elements in Combination with Others to Form Compounds or Alloys

I. Introduction

II. X-Ray Emission Spectra

III. Applications


Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis

I. Introduction

II. Qualitative Considerations

III. Experimental Techniques

IV. Quantitative Analysis

V. Scanning Images


The Influence of the Preparation of Metal Specimens on the Precision of Electron Probe Microanalysis

I. Introduction

II. Problems in Specimen Preparation

III. Effects of Surface Roughness

IV. Effects of Leaching, Deposition, Smearing, and Etching

V. Effects of Anodic or Vapor Deposited Films

VI. Conclusions


Electron Probe Microanalysis in Mineralogy

I. Introduction

II. Sample Preparation

III. Problems Inherent in Mineral Analysis

IV. Qualitative Analysis of Minerals

V. Quantitative Analysis of Minerals

VI. Examples of Electron Probe Analysis in Mineralogy

VII. Future Trends

VIII. Conclusions


Electron Probe Analysis in Metallurgy

I. Introduction

II. Applications in Metallography

III. Kinetic Processes

IV. Conclusion


Scanning Electron Probe Measurement of Magnetic Fields

I. Introduction

II. Basic Description of the Method

III. Magnetic Field Calculation

IV. Angular Deflection of Secondaries

V. Detected Signal Due to Magnetic Field

VI. Detected Signal Due to Surface Relief

VII. Other Limitations

VIII. Description of Detector

IX. Specimen Preparation

X. Measurement Techniques, Results and Discussion

XI. Image Displays

XII. Conclusions

Appendix I. Other Detector Applications

Appendix II. Specimen and Collector Currents under Bias


Appendix III. Magnetic Signal under Bias Conditions


Nondispersive X-Ray Emission Analysis for Lunar Surface Geochemical Exploration

I. Introduction

II. Data Analysis

III. Application of Least-Square Technique to an Experimental Problem


The Divergent Beam X-Ray Technique

List of Symbols

I. Introduction

II. Early Work

III. Formation of the Observed X-Ray Conic Sections

IV. Pattern Interpretation

V. Orientation of Crystals by Means of the Kossel Technique

VI. Use of the Kossel Technique to Study Mechanical and Thermodynamic Characteristics of Crystals

VII. Experimental Methods in Divergent Beam Diffraction

VIII. Contribution of Divergent Beam X-Ray Diffraction to Scientific Research


Author Index

Subject Index


No. of pages:
© Academic Press 1969
Academic Press
eBook ISBN:

About the Editor

A. J. Tousimis

L. Marton

Affiliations and Expertise

National Bureau of Standards, Washington, D. C.

Ratings and Reviews