Electron Probe Microanalysis

Electron Probe Microanalysis

1st Edition - January 1, 1969

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  • Editors: A. J. Tousimis, L. Marton
  • eBook ISBN: 9781483284637

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Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.

Table of Contents

  • Contents

    List of Contributors


    Survey of Microanalysis—Interpolation and Extrapolation



    Behavior of Electrons in a Specimen

    I. Introduction

    II. Backscattering and Diffusion of Electrons

    III. Spot Size of Diffused X-Ray Source and Depth Distribution of Characteristic X-Ray

    IV. Resolving Power of Electron Microprobe

    V. Application of Backscattered Electron and Specimen Current Methods


    The Sandwich Sample Technique Applied to Quantitative Microprobe Analysis

    I. Introduction

    II. The Absorption Correction

    III. Fluorescence Due to Characteristic Lines

    IV. The Atomic Number Effect

    V. A Model for Quantitative Electron Probe Microanalysis


    Quantitative Microprobe Analysis: A Basis for Universal Atomic Number Correction Tables and Victor G. Macres

    I. Introduction

    II. Formulation of Atomic Number Correction

    III. Discussion and Evaluation of the Correction Formula

    IV. Basis for Universal Correction Tables

    V. Application to Experimental Data

    VI. Summary and Conclusions

    Appendix I. Tabulation of λ' Values

    Appendix II. Example Calculation Using Universal Atomic Number Correction Tables

    Appendix III. Mass Absorption Coefficients

    Appendix IV. Mass Absorption Coefficients


    Deconvolution: A Technique to Increase Electron Probe Resolution


    I. Introduction

    II. Theory of the Deconvolution Method

    III. Mathematics of the Deconvolution Method

    IV. Experimental Measurements

    V. Reduction of Data

    VI. Discussion


    Analysis for Low Atomic Number Elements with the Electron Microprobe

    I. Introduction

    II. The Stearate Crystal

    III. Reduction of Carbon Contamination

    IV. Analysis of the Light Elements


    Changes in X-Ray Emission Spectra Observed between the Pure Elements and Elements in Combination with Others to Form Compounds or Alloys

    I. Introduction

    II. X-Ray Emission Spectra

    III. Applications


    Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis

    I. Introduction

    II. Qualitative Considerations

    III. Experimental Techniques

    IV. Quantitative Analysis

    V. Scanning Images


    The Influence of the Preparation of Metal Specimens on the Precision of Electron Probe Microanalysis

    I. Introduction

    II. Problems in Specimen Preparation

    III. Effects of Surface Roughness

    IV. Effects of Leaching, Deposition, Smearing, and Etching

    V. Effects of Anodic or Vapor Deposited Films

    VI. Conclusions


    Electron Probe Microanalysis in Mineralogy

    I. Introduction

    II. Sample Preparation

    III. Problems Inherent in Mineral Analysis

    IV. Qualitative Analysis of Minerals

    V. Quantitative Analysis of Minerals

    VI. Examples of Electron Probe Analysis in Mineralogy

    VII. Future Trends

    VIII. Conclusions


    Electron Probe Analysis in Metallurgy

    I. Introduction

    II. Applications in Metallography

    III. Kinetic Processes

    IV. Conclusion


    Scanning Electron Probe Measurement of Magnetic Fields

    I. Introduction

    II. Basic Description of the Method

    III. Magnetic Field Calculation

    IV. Angular Deflection of Secondaries

    V. Detected Signal Due to Magnetic Field

    VI. Detected Signal Due to Surface Relief

    VII. Other Limitations

    VIII. Description of Detector

    IX. Specimen Preparation

    X. Measurement Techniques, Results and Discussion

    XI. Image Displays

    XII. Conclusions

    Appendix I. Other Detector Applications

    Appendix II. Specimen and Collector Currents under Bias


    Appendix III. Magnetic Signal under Bias Conditions


    Nondispersive X-Ray Emission Analysis for Lunar Surface Geochemical Exploration

    I. Introduction

    II. Data Analysis

    III. Application of Least-Square Technique to an Experimental Problem


    The Divergent Beam X-Ray Technique

    List of Symbols

    I. Introduction

    II. Early Work

    III. Formation of the Observed X-Ray Conic Sections

    IV. Pattern Interpretation

    V. Orientation of Crystals by Means of the Kossel Technique

    VI. Use of the Kossel Technique to Study Mechanical and Thermodynamic Characteristics of Crystals

    VII. Experimental Methods in Divergent Beam Diffraction

    VIII. Contribution of Divergent Beam X-Ray Diffraction to Scientific Research


    Author Index

    Subject Index

Product details

  • No. of pages: 462
  • Language: English
  • Copyright: © Academic Press 1969
  • Published: January 1, 1969
  • Imprint: Academic Press
  • eBook ISBN: 9781483284637

About the Editors

A. J. Tousimis

L. Marton

Affiliations and Expertise

National Bureau of Standards, Washington, D. C.

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