Digital Circuit Testing - 1st Edition - ISBN: 9780127345802, 9780080504346

Digital Circuit Testing

1st Edition

A Guide to DFT and Other Techniques

Authors: Francis Wong
Hardcover ISBN: 9780127345802
eBook ISBN: 9780080504346
Imprint: Academic Press
Published Date: 28th July 1991
Page Count: 228
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Description

A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.

Readership

Professional engineers involved in designing, testing, and manufacturing digital integrated circuits and printed circuit boards.

Table of Contents

A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.

Details

No. of pages:
228
Language:
English
Copyright:
© Academic Press 1991
Published:
Imprint:
Academic Press
eBook ISBN:
9780080504346
Hardcover ISBN:
9780127345802

About the Author

Francis Wong

Affiliations and Expertise

Seattle University, Washington

Reviews

@qu:"The text, Digital Circuit Testing: A Guide to DFT and Other Techniques, introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than others....This book is intended to be an introduction to straight-forward testing techniques, easily applicable to the daily work of design and test engineers or as a course or reference text. The author accomplishes his purpose succinctly and in an easy-to-understand style." @source:--IEEE, INSTRUMENTATION AND MEASUREMENT SOCIETY NEWSLETTER