Confocal Scanning Optical Microscopy and Related Imaging Systems - 1st Edition - ISBN: 9780124087507, 9780080529783

Confocal Scanning Optical Microscopy and Related Imaging Systems

1st Edition

Authors: Gordon Kino Timothy Corle
eBook ISBN: 9780080529783
Hardcover ISBN: 9780124087507
Imprint: Academic Press
Published Date: 29th August 1996
Page Count: 335
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Description

This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given.

The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes.

Key Features

  • Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers
  • Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology
  • Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations
  • Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications
  • Discusses the theory and design of near-field optical microscopes
  • Explains phase imaging in the scanning optical and interference microscopes

Readership

Optical scientists, engineers, materials scientists, semiconductor testing engineers, biologists in testing instrumentation, and graduate students in these areas

Table of Contents

Instruments
Depth and Transverse Resolution
Phase Imaging
Applications
Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM

Details

No. of pages:
335
Language:
English
Copyright:
© Academic Press 1996
Published:
Imprint:
Academic Press
eBook ISBN:
9780080529783
Hardcover ISBN:
9780124087507

About the Author

Gordon Kino

Affiliations and Expertise

Stanford University

Timothy Corle

Affiliations and Expertise

National Applied Science