Confocal Scanning Optical Microscopy and Related Imaging Systems - 1st Edition - ISBN: 9780124087507, 9780080529783

Confocal Scanning Optical Microscopy and Related Imaging Systems

1st Edition

Authors: Gordon Kino Timothy Corle
Hardcover ISBN: 9780124087507
eBook ISBN: 9780080529783
Imprint: Academic Press
Published Date: 29th August 1996
Page Count: 335
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Description

Introduction. Instruments. Depth and Transverse Resolution. Phase Imaging. Applications. Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM.

Key Features

@introbul:Key Features @bul:* Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers

  • Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology
  • Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations
  • Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications
  • Discusses the theory and design of near-field optical microscopes
  • Explains phase imaging in the scanning optical and interference microscopes

Readership

Optical scientists, engineers, materials scientists, semiconductor testing engineers, biologists in testing instrumentation, and graduate students in these areas.

Table of Contents

Introduction. Instruments. Depth and Transverse Resolution. Phase Imaging. Applications. Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM.

Details

No. of pages:
335
Language:
English
Copyright:
© Academic Press 1996
Published:
Imprint:
Academic Press
eBook ISBN:
9780080529783
Hardcover ISBN:
9780124087507

About the Author

Gordon Kino

Affiliations and Expertise

Stanford University

Timothy Corle

Affiliations and Expertise

National Applied Science