Concise Encyclopedia of Materials Characterization - 2nd Edition - ISBN: 9780080445472, 9780080913957

Concise Encyclopedia of Materials Characterization

2nd Edition

Editors: Robert Cahn
Hardcover ISBN: 9780080445472
eBook ISBN: 9780080913957
Imprint: Elsevier Science
Published Date: 17th December 2004
Page Count: 1120
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To use materials effectively, their composition, physical and mechanical characteristics, and microstructure must be accurately determined. The second edition of this concise encyclopledia covers the wide range of characterization techniques necessary to achieve this.

With over 130 articles taken from the award-winning 'Encyclopedia of Materials: Science and Technology', containing revisions and updates not available in the original set, this concise encyclopedia is an ideal quick reference for materials scientists, chemists and engineers.

Key Features

· Extensive topical coverage, from traditional methods to the very latest in research. · Includes ScienceDirect updates and revisions not available in the original 'Encyclopedia of Materials: Science and Technology' · Over 500 illustrations, extensive cross-referencing, and a detailed index.


All materials scientists, chemists and engineers involved in research into any aspect of the characterization of materials

Table of Contents

CONTENTS Editor's Preface – newly written Alphabetical List of Articles An Introduction to Investigation and Characterization of Materials Acoustic Microscopy
Adhesives: Tests for Mechanical Properties
Amorphous Materials: Electron Spin Resonance
Amorphous Materials: Nuclear Magnetic Resonance, Amorphous Materials: Nuclear Spin Relaxation
Amorphous Materials: Small-Angle Scattering
Amorphous Materials: Vibrational Spectroscopy
Amorphous Materials: X-ray Absorption Spectroscopy
Analytical Transmission Electron Microscopy
Anodization Microscopy
Art Forgeries: Scientific Detection
Atomic Force Microscopy
Auger Electron Microscopy
Auger Microscopy: Angular Distribution
Brittle Materials: Strength Testing
Ceramics, Cathodoluminescence Analysis of
Ceramics: Fracture Toughness Testing
Ceramic Powders: Packing Characterization
Channelling-Enhanced Microanalysis
Chemical Analysis of Solid Surfaces
Combinatorial Screening
Composite Materials: Nondestructive Evaluation
Compton Scattering
Confocal Optical Microscopy
Corrosion and Oxidation Study Techniques
Corrosion: Test Methods
Crack Growth Measurement
Creep by Indentation
Creep, Creep Rupture and Stress Relaxation Testing Creep-Fatigue Interaction Testing
Dating Archaeological Materials
Deep Level Transient Spectroscopy
Depth Profiling
Diffusion: Novel Measurement Methods
*Diffusion Multiple Screening: Phase Diagram Mapping and Related Studies
Dislocations: Experimental Observation
Elastic Modulus Measurement
Elastomers: Spectroscopic Characterization
Elastomers: Tests for Mechanical Properties
Electron Diffraction
Electron Diffraction, Low-Energy
Electron Energy Loss Spectrometry
Electron Microscope Analysis of Defect Clusters, Voids and Bubbles
Electron Microscopy, High-Voltage
Electron Spectroscopy for Chemical Analysis
Electron Spin Resonance
Electron Tunnelling Spectroscopy
Electronic Raman Spectroscopy
Ellipsometry EMSAT, p. 2755 Fatigue(Multiaxial) Testing
Fatigue Testing
Fatigue Testing: Thermal and Thermomechanical
Field-Ion Microscopy
Field-Ion Microscopy: Atom Probe Microanalysis
Field-Ion Microscopy: Observation of Radiation Effects Fractal Analysis
Fracture of Polymeric Materials
Fracture Toughness Testing of Metallic Materials Gamma Radiography
Gamma-Ray Diffraction
Gas and Liquid Chromatography
Grain-Boundary Geometry: Measurement
Grain-Size: Nondestructive Evaluation
Hardness Testing
High-Resolution Electron Micrsocopy
High-Resolution Electron Microscopy of Interfaces Hydrogen as a Metallurgical Probe
Infrared Spectroscopy
Impact Testing
In-Reactor Creep Testing: Techniques
Ion Backscattering Analysis
Ion Chromatography
Junction Transient Spectroscopy
Kerr Microscopy
Laser Microprobe Mass Spectrometry
Laser Sampling Inductively Coupled Mass Spectrometry Liquid Chromatography Mass Spectrometry
Luminescence Imaging of Ceramics
Low-Energy Electron Diffraction
Magnetic Force Microscopy
Magnetic Materials: Measurements
Magnetic Materials: Transmission Electron Microscopy
Magnetic Measurements: Pulse Field
Magnetic Measurements: Quasistatic and AC
Magnetic Recording Measurements
Magnetic Systems: De Haas van Alphen Studies of Fermi Surface
Magnetism: Applications of Synchrotron Radiation Mechanical Properties Microprobe
Mechanical Testing at High Strain Rates
Mechanical Testing Methods of Fibers and Composites Mechanical Testing of Ceramics
Mechanical Testing: Overview
Microengineering of Materials: Characterization
Microstructural Evolution: Computer Simulation
Microtextural Analysis
Mössbauer Spectrometry
Nanoindentation Techniques
Nanometer-Scale Evaluation of Advanced Materials by Using Positrons
Neutron Activation Analysis
Neutron Diffraction
Neutron Radiography
Neutron Reflectometry for the Study of Absorption from Solution at Solid Surfaces, Nuclear Magnetic Resonance Spectroscopy
Optical Calorimetry
Optical Emission Spectroscopy
Optical Microscopy
Organic Mass Spectrometry
Oxide Surfaces by STM, Study of
Paper and Paperboard: Destructive Mechanical Testing
Paper and Paperboard: Nondestructive Evaluation
Paper Surfaces: Subjective Evaluation
Particle-Induced X-Ray Emission
Perturbed Angular Correlations (PAC)
Phase Diagrams and Phase Stability: Calculations Photoelasticity
Photoelectron Diffraction
Pole Figures and Orientation Distribution Functions Polymer Dielectric Properties: Test Methods
Polymers: Electron Micsocopy
Polymers: Light Microscopy
Polymers: Molecular Weight and its Distribution
Polymers: Neutron Scattering
Polymers: Raman Spectroscopy
Polymers: Tests for Degradation and Stabilisation Polymers: Tests for Flammability
Polymers: Tests for Mechanical Properties
Polymers: Tests for Thermal Properties
Polymers: Thermal Analysis
Polymers: X-Ray Scattering
Porosity: Characterization and Investigation
Positron Annihilation Spectroscopy of Defects in Metals
Positron-Annihilation Techniques, Advanced, for Materials Research Powder Characterization
Powder Mechanics
Raman Spectroscopy and Microscopy
Reflection Electron Microscopy Concise, p. 409 Residual Stresses: Measurement by Diffraction
Residual Stresses: Measurement by Raman Shift
Residual Stresses: Measurement using Magnetoelastic Effects
Residual Stresses: Measurement using Neutron Diffraction
Scanning Electron Microscopy
Scanning SQUID Microscope
Scanning Tunneling Microscopy and Spectroscopy
Secondary–Ion Mass Spectrometry
Semiconductor Materials: Characterization by Etching
Semiconducting Materials: Electron Microscopy
Semiconductors, Electrical Evaluation of
Semiconductors, Local Vibrational Mode Spectroscopy Semiconductors, Raman Spectroscopy of
Semiconductors, Scanning Photoluminescence
Semicrystalline Polymers: Lamellar Morphology by SAXS
Single-Crystal X-Ray Diffraction
Small-Specimen Mechanical Testing
Solid-State Nuclear Track Detectors: Applications Solid State: Study Using Muon Beams
Spark-Source Mass Spectrography
SQUIDS: Magnetic Microscopy EMSAT, p. 8787 SQUIDS: The Instrument
Stress Distribution: Analysis Using Thermoelastic Effect
Superconducting Materials: Measurements
Surface Chemistry: Electron Yield Spectroscopy
Surface Chemistry: EXAFS
Surface Evaluation by Atomic Force Microscopy
Surface Photochemistry
Thermal Transport Properties, Measurement of
Texture: Nondestructive Characterization
Thermal Analysis: An Overview
Thermal Analysis: More Recent Developments
Thermal Wave Imaging
Thermally Contracting Materials: Characterisation Thermodynamic Activity: Measurement
Thermophysical Measurements, Subsecond
Thin Films: Characterization by X-Rays
Thin Films: In-Situ Stress Measurement of
Thin Films: Mechanical Testing
Thin Films: Stress Measurement Techniques
Transmission Electron Microscopy
Wood: Acoustic Emission and Acousto-Ultrasonic Characteristics
X-Ray Absorption Spectroscopy: EXAFS and XANES Techniques
X-Ray and Neutron Diffraction Studies of Amorphous Solids
X-Ray and Neutron Diffuse Scattering of Radiation-Induced Defects
X-Ray Diffraction, Time-Resolved
X-Ray Fluorescence Spectrometry
X-Ray Microanalysis, Quantitative
X-Ray Diffraction
X-Ray Powder Diffraction
X-Ray Topography


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About the Editor

Robert Cahn

Robert S. Cahn received his B.S. from the University of Chicago in 1966 and his Ph.D. in Mathematics from Yale University in 1970. From 1970 until 1982, he was a member of the Department of Mathematics and Computer Science of the University of Miami and of the Mathematics Department of Lehman College from 1983-1985. In 1986 he joined the IBM Communications Department working on network design algorithms and network design tools. He has also designed a number of very large, high-speed networks for both IBM and IBM customers. He is the author or over 20 research articles spanning his various interests. He is adjunct professor of Computer Science at Polytechnic University and regularly teaches about network design.

Affiliations and Expertise

Cambridge University