Concise Encyclopedia of Materials Characterization

Concise Encyclopedia of Materials Characterization

2nd Edition - December 17, 2004

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  • Editor: Robert Cahn
  • Hardcover ISBN: 9780080445472

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To use materials effectively, their composition, physical and mechanical characteristics, and microstructure must be accurately determined. The second edition of Concise Encyclopedia of Materials Characterization covers the wide range of characterization techniques necessary to achieve this. With over 130 articles taken from the award-winning Encyclopedia of Materials: Science and Technology, containing revisions and updates not available in the original set, this concise encyclopedia is an ideal quick reference for materials scientists, chemists and engineers.

Key Features

  • Extensive topical coverage, from traditional methods to the very latest in research
  • Includes ScienceDirect updates and revisions not available in the original Encyclopedia of Materials: Science and Technology
  • Over 500 illustrations, extensive cross-referencing, and a detailed index


All materials scientists, chemists and engineers involved in research into any aspect of the characterization of materials

Table of Contents

  • Editor's Preface – newly written
    Alphabetical List of Articles
    An Introduction to Investigation and Characterization of Materials
    Acoustic Microscopy
    Adhesives: Tests for Mechanical Properties
    Amorphous Materials: Electron Spin Resonance
    Amorphous Materials: Nuclear Magnetic Resonance,
    Amorphous Materials: Nuclear Spin Relaxation
    Amorphous Materials: Small-Angle Scattering
    Amorphous Materials: Vibrational Spectroscopy
    Amorphous Materials: X-ray Absorption Spectroscopy
    Analytical Transmission Electron Microscopy
    Anodization Microscopy
    Art Forgeries: Scientific Detection
    Atomic Force Microscopy
    Auger Electron Microscopy
    Auger Microscopy: Angular Distribution
    Brittle Materials: Strength Testing
    Ceramics, Cathodoluminescence Analysis of
    Ceramics: Fracture Toughness Testing
    Ceramic Powders: Packing Characterization
    Channelling-Enhanced Microanalysis
    Chemical Analysis of Solid Surfaces
    Combinatorial Screening
    Composite Materials: Nondestructive Evaluation
    Compton Scattering
    Confocal Optical Microscopy
    Corrosion and Oxidation Study Techniques
    Corrosion: Test Methods
    Crack Growth Measurement
    Creep by Indentation
    Creep, Creep Rupture and Stress Relaxation Testing
    Creep-Fatigue Interaction Testing
    Dating Archaeological Materials
    Deep Level Transient Spectroscopy
    Depth Profiling
    Diffusion: Novel Measurement Methods
    *Diffusion Multiple Screening: Phase Diagram Mapping and Related Studies
    Dislocations: Experimental Observation
    Elastic Modulus Measurement
    Elastomers: Spectroscopic Characterization
    Elastomers: Tests for Mechanical Properties
    Electron Diffraction
    Electron Diffraction, Low-Energy
    Electron Energy Loss Spectrometry
    Electron Microscope Analysis of Defect Clusters, Voids and Bubbles
    Electron Microscopy, High-Voltage
    Electron Spectroscopy for Chemical Analysis
    Electron Spin Resonance
    Electron Tunnelling Spectroscopy
    Electronic Raman Spectroscopy
    Ellipsometry EMSAT, p. 2755
    Fatigue(Multiaxial) Testing
    Fatigue Testing
    Fatigue Testing: Thermal and Thermomechanical
    Field-Ion Microscopy
    Field-Ion Microscopy: Atom Probe Microanalysis
    Field-Ion Microscopy: Observation of Radiation Effects
    Fractal Analysis
    Fracture of Polymeric Materials
    Fracture Toughness Testing of Metallic Materials
    Gamma Radiography
    Gamma-Ray Diffraction
    Gas and Liquid Chromatography
    Grain-Boundary Geometry: Measurement
    Grain-Size: Nondestructive Evaluation
    Hardness Testing
    High-Resolution Electron Micrsocopy
    High-Resolution Electron Microscopy of Interfaces
    Hydrogen as a Metallurgical Probe
    Infrared Spectroscopy
    Impact Testing
    In-Reactor Creep Testing: Techniques
    Ion Backscattering Analysis
    Ion Chromatography
    Junction Transient Spectroscopy
    Kerr Microscopy
    Laser Microprobe Mass Spectrometry
    Laser Sampling Inductively Coupled Mass Spectrometry
    Liquid Chromatography Mass Spectrometry
    Luminescence Imaging of Ceramics
    Low-Energy Electron Diffraction
    Magnetic Force Microscopy
    Magnetic Materials: Measurements
    Magnetic Materials: Transmission Electron Microscopy
    Magnetic Measurements: Pulse Field
    Magnetic Measurements: Quasistatic and AC
    Magnetic Recording Measurements
    Magnetic Systems: De Haas van Alphen Studies of Fermi Surface
    Magnetism: Applications of Synchrotron Radiation
    Mechanical Properties Microprobe
    Mechanical Testing at High Strain Rates
    Mechanical Testing Methods of Fibers and Composites
    Mechanical Testing of Ceramics
    Mechanical Testing: Overview
    Microengineering of Materials: Characterization
    Microstructural Evolution: Computer Simulation
    Microtextural Analysis
    Mössbauer Spectrometry
    Nanoindentation Techniques
    Nanometer-Scale Evaluation of Advanced Materials by Using Positrons
    Neutron Activation Analysis
    Neutron Diffraction
    Neutron Radiography
    Neutron Reflectometry for the Study of Absorption from Solution at Solid Surfaces,
    Nuclear Magnetic Resonance Spectroscopy
    Optical Calorimetry
    Optical Emission Spectroscopy
    Optical Microscopy
    Organic Mass Spectrometry
    Oxide Surfaces by STM, Study of
    Paper and Paperboard: Destructive Mechanical Testing
    Paper and Paperboard: Nondestructive Evaluation
    Paper Surfaces: Subjective Evaluation
    Particle-Induced X-Ray Emission
    Perturbed Angular Correlations (PAC)
    Phase Diagrams and Phase Stability: Calculations
    Photoelectron Diffraction
    Pole Figures and Orientation Distribution Functions
    Polymer Dielectric Properties: Test Methods
    Polymers: Electron Micsocopy
    Polymers: Light Microscopy
    Polymers: Molecular Weight and its Distribution
    Polymers: Neutron Scattering
    Polymers: Raman Spectroscopy
    Polymers: Tests for Degradation and Stabilisation
    Polymers: Tests for Flammability
    Polymers: Tests for Mechanical Properties
    Polymers: Tests for Thermal Properties
    Polymers: Thermal Analysis
    Polymers: X-Ray Scattering
    Porosity: Characterization and Investigation
    Positron Annihilation Spectroscopy of Defects in Metals
    Positron-Annihilation Techniques, Advanced, for Materials Research
    Powder Characterization
    Powder Mechanics
    Raman Spectroscopy and Microscopy
    Reflection Electron Microscopy Concise, p. 409
    Residual Stresses: Measurement by Diffraction
    Residual Stresses: Measurement by Raman Shift
    Residual Stresses: Measurement using Magnetoelastic Effects
    Residual Stresses: Measurement using Neutron Diffraction
    Scanning Electron Microscopy
    Scanning SQUID Microscope
    Scanning Tunneling Microscopy and Spectroscopy
    Secondary–Ion Mass Spectrometry
    Semiconductor Materials: Characterization by Etching
    Semiconducting Materials: Electron Microscopy
    Semiconductors, Electrical Evaluation of
    Semiconductors, Local Vibrational Mode Spectroscopy
    Semiconductors, Raman Spectroscopy of
    Semiconductors, Scanning Photoluminescence
    Semicrystalline Polymers: Lamellar Morphology by SAXS
    Single-Crystal X-Ray Diffraction
    Small-Specimen Mechanical Testing
    Solid-State Nuclear Track Detectors: Applications
    Solid State: Study Using Muon Beams
    Spark-Source Mass Spectrography
    SQUIDS: Magnetic Microscopy EMSAT, p. 8787
    SQUIDS: The Instrument
    Stress Distribution: Analysis Using Thermoelastic Effect
    Superconducting Materials: Measurements
    Surface Chemistry: Electron Yield Spectroscopy
    Surface Chemistry: EXAFS
    Surface Evaluation by Atomic Force Microscopy
    Surface Photochemistry
    Thermal Transport Properties, Measurement of
    Texture: Nondestructive Characterization
    Thermal Analysis: An Overview
    Thermal Analysis: More Recent Developments
    Thermal Wave Imaging
    Thermally Contracting Materials: Characterisation
    Thermodynamic Activity: Measurement
    Thermophysical Measurements, Subsecond
    Thin Films: Characterization by X-Rays
    Thin Films: In-Situ Stress Measurement of
    Thin Films: Mechanical Testing
    Thin Films: Stress Measurement Techniques
    Transmission Electron Microscopy
    Wood: Acoustic Emission and Acousto-Ultrasonic Characteristics
    X-Ray Absorption Spectroscopy: EXAFS and XANES Techniques
    X-Ray and Neutron Diffraction Studies of Amorphous Solids
    X-Ray and Neutron Diffuse Scattering of Radiation-Induced Defects
    X-Ray Diffraction, Time-Resolved
    X-Ray Fluorescence Spectrometry
    X-Ray Microanalysis, Quantitative
    X-Ray Diffraction
    X-Ray Powder Diffraction
    X-Ray Topography

Product details

  • No. of pages: 1120
  • Language: English
  • Copyright: © Elsevier Science 2004
  • Published: December 17, 2004
  • Imprint: Elsevier Science
  • Hardcover ISBN: 9780080445472

About the Editor

Robert Cahn

Robert S. Cahn received his B.S. from the University of Chicago in 1966 and his Ph.D. in Mathematics from Yale University in 1970. From 1970 until 1982, he was a member of the Department of Mathematics and Computer Science of the University of Miami and of the Mathematics Department of Lehman College from 1983-1985. In 1986 he joined the IBM Communications Department working on network design algorithms and network design tools. He has also designed a number of very large, high-speed networks for both IBM and IBM customers. He is the author or over 20 research articles spanning his various interests. He is adjunct professor of Computer Science at Polytechnic University and regularly teaches about network design.

Affiliations and Expertise

Cambridge University

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