Characterization of Semiconductor Heterostructures and Nanostructures

2nd Edition

Editors: Giovanni Agostini Carlo Lamberti
Hardcover ISBN: 9780444595515
eBook ISBN: 9780444595492
Imprint: Elsevier Science
Published Date: 27th February 2013
Page Count: 828
185.00 + applicable tax
115.00 + applicable tax
143.00 + applicable tax
Unavailable
Compatible Not compatible
VitalSource PC, Mac, iPhone & iPad Amazon Kindle eReader
ePub & PDF Apple & PC desktop. Mobile devices (Apple & Android) Amazon Kindle eReader
Mobi Amazon Kindle eReader Anything else

Institutional Access


Description

Characterization of Semiconductor Heterostructures and Nanostructures” is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling.

The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. 

The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology.

Key Features

  • Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures
  • Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field
  • Each chapter starts with a didactic introduction on the technique
  • The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures

Readership

Researchers and professors and Master and PhD students in physics, chemistry, materials science and engineering fields

Table of Contents

Dedication

Preface

Contributors

Chapter 1. Introduction: The Interdisciplinary Nature of and Nanotechnology and Its Need to Exploit Frontier Characterization Techniques

1 The Scientific and Editorial Booming of Nanotechnology in the New Millennium

2 Heterostructures and Nanostructures: Definition and Applications, from Optoelectronic to Catalysis

3 Dynamic Interplay among Growth/Synthesis Techniques, Theoretical Modeling and Characterization Techniques in the Design and Improvement of Semiconductor Heterostructure-Based Devices

4 Purposes of the Book and Chapters Layout

References

Chapter 2. Ab initio Studies of Structural and Electronic Properties

1 Introduction

2 Basic Models for Band Alignments

3 Computational Approach

4 Band Offsets

5 Designing Heterostructures and Engineering Band Offsets

6 Electronic States

7 Complex Heterostructures for Advanced Applications

8 Summary and Future Perspectives

Acknowledgments

References and Notes

Chapter 3. Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-Ray Diffraction

1 Introduction

2 Lattice-Mismatched and Pseudomorphic Heterostructures

3 X-ray Diffraction Profiles of Semiconductor Heterostructures

4 Determination of the Composition of Semiconductor Alloy Heterostructures

5 Strain Release in Semiconductor Heterostructures

6 Experimental Results

7 Summary and Future Perspectives

References

Chapter 4. Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams

1 Introduction

2 Experimental Setups

3 Scientific Background for Grazing Incidence X-Ray Techniques on Nanostructures

4 Examples of Grazing Incidence Techniques Applied to Nanostructures

5 Focused X-Rays Applied to the Study of Ind

Details

No. of pages:
828
Language:
English
Copyright:
© Elsevier Science 2013
Published:
Imprint:
Elsevier Science
eBook ISBN:
9780444595492
Hardcover ISBN:
9780444595515

About the Editor

Giovanni Agostini

Affiliations and Expertise

Department of Inorganic, Physical & Materials Chemistry, University of Torino, Italy

Carlo Lamberti

Affiliations and Expertise

Department of Inorganic, Physical & Materials Chemistry, University of Torino, Italy

Reviews

"For graduate students in their disciplines, physicists, chemists, and material scientists and engineers set out the basic concepts of selected techniques for characterizing the heterostructures and nanostructures of semiconductors. The second part of each chapter presents example findings of the technique described in the recent literature." --Reference and Research Book News, October 2013