
Characterization of Semiconductor Heterostructures and Nanostructures
Description
Key Features
- Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures
- Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field
- Each chapter starts with a didactic introduction on the technique
- The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures
Readership
Table of Contents
Dedication
Preface
Contributors
Chapter 1. Introduction: The Interdisciplinary Nature of and Nanotechnology and Its Need to Exploit Frontier Characterization Techniques
1 The Scientific and Editorial Booming of Nanotechnology in the New Millennium
2 Heterostructures and Nanostructures: Definition and Applications, from Optoelectronic to Catalysis
3 Dynamic Interplay among Growth/Synthesis Techniques, Theoretical Modeling and Characterization Techniques in the Design and Improvement of Semiconductor Heterostructure-Based Devices
4 Purposes of the Book and Chapters Layout
References
Chapter 2. Ab initio Studies of Structural and Electronic Properties
1 Introduction
2 Basic Models for Band Alignments
3 Computational Approach
4 Band Offsets
5 Designing Heterostructures and Engineering Band Offsets
6 Electronic States
7 Complex Heterostructures for Advanced Applications
8 Summary and Future Perspectives
Acknowledgments
References and Notes
Chapter 3. Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-Ray Diffraction
1 Introduction
2 Lattice-Mismatched and Pseudomorphic Heterostructures
3 X-ray Diffraction Profiles of Semiconductor Heterostructures
4 Determination of the Composition of Semiconductor Alloy Heterostructures
5 Strain Release in Semiconductor Heterostructures
6 Experimental Results
7 Summary and Future Perspectives
References
Chapter 4. Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams
1 Introduction
2 Experimental Setups
3 Scientific Background for Grazing Incidence X-Ray Techniques on Nanostructures
4 Examples of Grazing Incidence Techniques Applied to Nanostructures
5 Focused X-Rays Applied to the Study of Individual Nanostructures
6 Summary and Future Perspective
References
Chapter 5. Small-Angle X-Ray Scattering for the Study of Nanostructures and Nanostructured Materials
1 Introduction
2 Theory of SAXS
3 Application of SAXS Technique
Acknowledgments
References
Chapter 6. Local Structure of Bulk and Nanocrystalline Semiconductors Using Total Scattering Methods
1 Introduction
2 The Total Scattering PDF Method
3 Example: Motional Correlations in Bulk Crystalline Semiconductors
4 Example: Disorder due to Alloying in Bulk Semiconductor Alloys
5 Example: Nanoscale Fluctuations in Pure Bulk Semiconductors
6 Example: Structure, Defects, Strain, and Size in Semiconductor NPs
7 Summary and Perspectives on the Future
References
Chapter 7. X-Ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures
1 Introduction to X-ray Absorption Spectroscopy for Local Structural Studies
2 Detection Schemes and Experimental Set-ups Relevant for Semiconductor Research
3 A Review of the Use of XAFS in the Field of Semiconductor Heterostructures and Nanostructures
4 Summary and Perspectives
Acknowledgments
References
Chapter 8. Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures
1 Introduction
2 Basic Principles
3 Experimental Setup
4 Data Analysis
5 Applications to Semiconductors Nanostructures
6 Summary and Perspectives
Acknowledgments
References
Chapter 9. Micro- and Nano-X-ray Beams
1 Introduction
2 Basic Resolution Limits
3 Advantages of Micro- and Nano-X-Ray Beams
4 XRM Modalities
5 X-Ray Focusing Optics
6 Analytical Methods
7 Applications
8 Summary and Future Perspectives
References
Chapter 10. Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures
1 Introduction
2 Experimental: Basic of the Electron Microscope
3 Diffraction Contrast in TEM Images
4 Phase Contrast
5 Other Techniques
6 Applications
Appendix A
References
Chapter 11. Imaging at the Nanoscale: Scanning Probe Microscopies Applied to Semiconductors
1 Introduction
2 Experimental Setup
3 Case Studies
4 Summary and Future Perspectives
References
Chapter 12. Photoluminescence Characterization of Structural and Electronic Properties of Semiconductor Quantum Wells
1 Introduction
2 Experimental Systems and Techniques
3 Electronic and Optical Properties of Quantum Structures
4 PL Characterization of III–V Semiconductor QWs
5 PL of Ge/SiGe QWs: A Quasi-Direct System
6 Summary
References
Chapter 13. Cathodoluminescence of Self-assembled Nanosystems: The Cases of Tetrapods, Nanowires, and Nanocrystals
1 Short Introduction to Cathodoluminescence Spectroscopy
2 Unpredicted Nucleation of Extended ZB Phases in WZ ZnO Nanotetrapod Arms
3 Enhancement of the Core NBE Emission Induced by Amorphous Shell in Coaxial One-Dimensional Nanostructure: The Case of SiC/SiO2 Core/Shell Self-organized NWS
4 Excitonic Recombination in Superstoichiometric Nanocrystalline TiO2 Grown by Cluster Precursors at RT
5 Conclusions
Acknowledgments
References
Chapter 14. The Role of Photoemission Spectroscopies in Heterojunction Research
1 Introduction
2 Angle-resolved Photoemission
3 Local Chemical Analysis
4 Photoemission Spectromicroscopy
5 Case Studies
6 Recent Developments
7 Summary and Conclusions
References
Chapter 15. Electrical and Electro-Optical Characterization of Semiconductor Nanowires
1 Introduction. Semiconductor Nanowires
2 Electrical Measurements
3 Photocurrent Spectroscopy
4 Charge Collection Microscopy
5 Electroluminescence Spectroscopy
6 Transport Properties of GAN Nanowires
7 Electron Transport in III-N axial NW Heterostructures
8 Optoelectronic Properties of Single-Wire InGaN/GaN MQW Devices
Acknowledgments
References
Chapter 16. Electron Spin Resonance of Interfaces and Nanolayers in Semiconductor Heterostructures
1 Introduction
2 ESR Technique
3 Probing Semiconductor/Insulator Interfaces Through Inherent Point Defects
4 Paramagnetic Defects in Dielectric Layers
5 Summary and Future Perspectives
References
Chapter 17. Raman Spectroscopy
1 Introduction
2 Experimental Methods
3 Applications
4 Summary and Future Perspectives
Acknowledgments
References
Index
Product details
- No. of pages: 828
- Language: English
- Copyright: © Elsevier Science 2013
- Published: February 27, 2013
- Imprint: Elsevier Science
- Hardcover ISBN: 9780444595515
- eBook ISBN: 9780444595492
About the Editors
Giovanni Agostini
Affiliations and Expertise
Carlo Lamberti
Affiliations and Expertise
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