2. Characterization of Physical Properties
3. Bulk and Surface Chemical Characterization of Nanoparticles
4. Advantages by Combination of Methods and New Methods on the Horizon
5. Survey on Metrology and Standardization
Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge.
In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.
- Helps readers decide which nanocharacterization method is best for each measurement problem, including limitations, advantages and disadvantages
- Shows which nanocharacterization methods are best for different classes of nanomaterial
- Demonstrates the practical use of a method based on selected case studies
Materials scientists, chemists and chemical engineers who are looking to learn more about nanocharacterization for materials selection at the nanoparticle level
- No. of pages:
- © Elsevier 2019
- 1st August 2019
- Paperback ISBN:
His research focuses on characterization of new materials, specifically nanoparticles, thin films and 2D materials.
Head of Surface Analysis and Interfacial Chemistry, at BAM Federal Institute for Materials Research and Testing, Berlin, Germany
His research focuses on the metrological and standardization approaches nanoparticle characterization
Lecturer, Academy of Electron Microscopy and Analytics, Munster, Germany
His research focus on accurate measurements of chemistry using surface analytical techniques. and chemical measurements of nanoparticles and their surfaces
National Physical Laboratory