Part I: Strategies and Tactics: 1. What is a Test Strategy?; 2. Test Methods; 3. Inspection as Test; 4. Guidelines for a Cost-Effective "Test" Operation; Part II: Making the Job Easier: 5. Reducing Test-Generation Pain with Boundary Scan; 6. The VMEbus eXtension for Instrumentation; 7. Environmental-Stress Screening; Part III: Creating Test Solutions: 8. Evaluating Real Tester Speeds; 9. Test-Program Development and Simulation; Part IV: Pulling It All Together: 10. Test-Strategy Economics; 11. Formulating a Board-Test Strategy; 12. Test Strategy Decisions; 13. Conclusion; Appendix: Time-Value-of-Money Tables; Acronym Glossary; Bibliography
Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality."
In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decisionmaking. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic.
Discusses ball-grid arrays and other new devices and attachment technologies Adds a comprehensive new chapter on optical, infrared, and x-ray inspection *Covers vectorless techniques for detecting surface-mount open-circuit board failures
Engineers, technical managers
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- © Newnes 2001
- 12th October 2001
- Hardcover ISBN:
- eBook ISBN:
Principal, ConsuLogic Consulting Services. Former Editor, Test & Measurement Europe. Former Senior Technical Editor, Test & Measurement World