Atom Probe Tomography
Put Theory Into Practice
Free Global Shipping
No minimum orderDescription
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.
Key Features
- Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
- Written for both experienced researchers and new users
- Includes exercises, along with corrections, for users to practice the techniques discussed
- Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Readership
Masters degree and Ph.D. students, Research engineers and senior scientists, University professors
Table of Contents
- Preface
- List of Abbreviations
- Chapter One. Early Developments and Basic Concepts
- Introduction
- Atom Probe Tomography in Materials Science Today
- Basic Concepts
- Concluding Remarks, the Specificities of Atom Probe Tomography
- Chapter Two. Field Ion Emission Mechanisms
- Introduction
- Field Generation at the Surface of a Field Emitter
- Field Emission at the Tip Surface From Electron Emission to Field Evaporation
- Trajectories of Ions After Ionization or Field Evaporation in the Atom Probe
- Conclusion
- Chapter Three. Basics of Field Ion Microscopy
- Introduction
- Basic Principles
- Field Ion Microscopy in Materials Science
- Conclusion
- Chapter Four. Atom Probe Sample Preparation
- Specimen Preparation by Electropolishing
- Sample Preparation Using Focused Ion Beam Milling
- Conclusions
- Chapter Five. Time-of-Flight Mass Spectrometry and Composition Measurements
- Introduction
- General Concepts and Definitions
- Optimizing the Mass Spectrum in Atom Probe Tomography
- Extracting Information From Mass Spectra
- Chapter Six. Atom Probe Tomography: Detector Issues and Technology
- Introduction
- Microchannel Plate Assembly
- Conventional Delay Line Detector
- Conventional Measure of Timing Information
- Accuracy of Conventional Delay Line Detector for Single Events
- Coevaporation Effect
- Accuracy of Conventional Delay Line Detector for Multiple Events
- Advanced Delay Line Detector
- Influence of Detection Systems Performances on Low-Angle Atom Probe Accuracy
- Influence of Detection Systems on Atom Probe Accuracy in Wide-Angle AP
- Effect of Multiple Events Detection on Composition
- Conclusion
- Chapter Seven. Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches
- Classical Methods of Tomographic Reconstruction
- A Few Words on Metrological Performances and Terminology
- Spatial Precision
- Improving Spatial Accuracy of APT Images
- Conclusions and Perspectives
- Chapter Eight. Laser-Assisted Field Evaporation
- Introduction
- Historical Background of Field Evaporation Assisted by Laser Pulses
- Optical Properties of Nano Tips
- Physical Mechanisms of Field Evaporation Assisted by Laser Pulses
- Consequences on the La-APT Performances
- Conclusions and Perspectives
- Chapter Nine. Data Mining
- Preliminary Definitions
- Building the Tools
- Relevance of the Approach as a Function of the Feature of Interest
- Identifying the Bias
- Conclusion
- Chapter Ten. Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography
- Motivations for a Correlative Approach
- Relevant Techniques for a Correlative Approach
- Experimental Protocols
- Degradation of Specimen due to Observation in STEM
- Correlation of Conventional TEM or BF-STEM and APT
- Correlation of STEM Imaging and APT: Focus on the HAADF Mode
- Correlation of Electron Tomography and APT
- Correlative Microscopy in a Dedicated Instrument
- Chapter Eleven. Combining Atom Probe Tomography and Optical Spectroscopy
- Introduction
- Relationships Between Chemistry, Structure, and Optics in Nanoscale Materials
- Experimental Approaches
- Appendix A
- Appendix B
- Index
Product details
- No. of pages: 416
- Language: English
- Copyright: © Academic Press 2016
- Published: May 30, 2016
- Imprint: Academic Press
- eBook ISBN: 9780128047453
- Hardcover ISBN: 9780128046470
About the Editors
Williams Lefebvre
Williams Lefebvre, Ph.D., is Associate Professor, Materials Physics Group, University of Rouen, France. He received his Ph.D. in Materials Science in Rouen in 2001 for his correlative analysis by transmission electron microscopy and atom probe tomography (APT) of phase transformations in titanium aluminides. He earned a fellowship to the Japan Society for the promotion of science in 2002, when he visited the NIMS of Tsukuba. Since 2014, he has also been a visiting adjunct research associate professor at the University of Nebraska, Lincoln, USA, where has has been leading research activities in the field of physical metallurgy, focusing on light alloys systems, aiming at improving the methodology associated with the investigation of early stages of precipitation by APT and scanning transmission electron microscopy.
Affiliations and Expertise
Materials Physics Group, University of Rouen, France
Francois Vurpillot
Francois Vurpillot, Ph.D., has been Assistant Professor, Materials Physics Group (GPM), University of Rouen, France since 2003. After receiving his Ph.D. at the GPM in 2001, he spent one year at the Department of Materials at the University of Oxford, as a post-doctoral researcher funded by a Marie Curie fellowship support. He is the current vice-president of the International Field Emission Society (IFES) and leader of the Instrumentation team at the GPM. Francois Vurpillot pioneered the combination of experimental and simulated data in APT, which has been a breakthrough in the development of the technique for the nano analysis in material science.
Affiliations and Expertise
Materials Physics Group, University of Rouen, France
Xavier Sauvage
Xavier Sauvage, Ph.D., Senior Scientist, Materials Physics Group, University of Rouen, France defended his Ph.D. at the University of Rouen in 2001. The topic was utilizing Atom Probe Tomography (APT) in the investigation of phase transformations in nanoscaled composites processed by severe plastic deformation. After a post-doc position at the Max Planck Institut of Stuttgart, he was hired as research scientist at the Materials Physics Group, University of Rouen to lead some research on nanostructured materials. Dr. Sauvage is now leader of the Materials under Extreme Nanostructures and Energy research team, in which atomic scale microscopy techniques are used for the investigation of fundamental mechanisms in materials under extreme conditions like irradiation or severe plastic deformation.
Affiliations and Expertise
Materials Physics Group, University of Rouen, France