Description

This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery

Key Features

* Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors * Shows readers how to quantify their soft error reliability * Provides state-of-the-art techniques to protect against soft errors

Readership

Practitioners in semi-conductor industry, researchers & developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. I will describe many basic and advanced techniques to make this book of interest to this broad audience.

Details

No. of pages:
360
Language:
English
Copyright:
© 2008
Published:
Imprint:
Morgan Kaufmann
Print ISBN:
9780123695291
Electronic ISBN:
9780080558325

About the author

Shubu Mukherjee

Affiliations and Expertise

Principal Engineer and Director, SPEARS (Simulation & Pathfinding of Efficient and Reliable Systems): Intel

Reviews

"Dr. Shubu Mukherjee's book is a welcome surprise: books by architecture leaders in major companies are few and far between. Written from the viewpoint of a working engineer, the book describes sources of soft errors and solutions involving device, logic, and architecture design to reduce the effects of soft errors." - Max Baron, Microprocessor Report - May 27, 2008