Application Specific Integrated Circuit (ASIC) Technology

1st Edition - February 28, 1991
Editor: Norman Einspruch
Language: English
eBook ISBN:
9 7 8 - 0 - 3 2 3 - 1 5 3 2 3 - 2

Application Specific Integrated Circuit (ASIC) Technology explores and discusses the different aspects of the ASIC technology experienced during the 1990s. The topics of the… Read more

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Application Specific Integrated Circuit (ASIC) Technology explores and discusses the different aspects of the ASIC technology experienced during the 1990s. The topics of the chapters range from the ASIC business, model, marketing, and development up to its testability, packaging, and quality and reliability. An introductory chapter begins the discussion and tackles the historical perspective and the classification of the ASIC technology. Chapters 2 and 3 cover the business side of the technology as it discusses the market dynamics and marketing strategies. The following chapters focus on the product itself and deal with the design and model and library development. Computer-aided design tools and systems are included in the discussion. Manufacturing and packaging of ASICs are also given attention in the book. Finally, the last three chapters present the application, testability, and reliability of ASIC technology. The text can be of most help to students in the fields of microelectronics, computer technology, and engineering.

Contributors

Preface

Chapter 1 Introduction to ASIC Technology

I. Overview

II. Volume Summary

Reference

Chapter 2 Market Dynamics of the ASIC Revolution

I. Introduction

II. Anatomy of the ASIC Revolution

III. Market Forces Driving the ASIC Revolution

IV. Factors Limiting ASIC Market Growth

V. Profile of the ASIC Market

VI. Fragmentation of the ASIC Market

VII. Shifting Forces in the ASIC Market

VIII. Conclusion

Chapter 3 Marketing ASICs

I. Introduction

II. The ASIC Product Framework

III. The ASIC Market Framework

IV. The Marketing Tool Set

V. The ASIC Sales Strategy

VI. Positioning for Success

VII. Conclusion

Bibliography

Chapter 4 Design and Architecture of ASIC Products

I. Introduction

II. Gate Array Design Methodologies and Architectures

III. Cell-Based Design Methodologies and Architectures

IV. Embedded Megafunction and Memory Design

V. Requirements of Gate and Block Level Interconnect Technology

VI. Testability Concepts

VII. Future of ASIC Products and Architectures

References

Chapter 5 Model and Library Development

I. Introduction

II. Model Development

III. Library Development

References

Chapter 6 Computer-Aided Design Tools and Systems

I. Introduction

II. A Brief History of ASIC CAD

III. Low-Complexity Gate Array

IV. High-Complexity Gate Array

V. High-Complexity Cell-Based Designs

VI. Mixed Analog/Digital Design

VII. ASIC Internal Tools

VIII. Who Makes Tools?

IX. How Tools Are Created

X. What is Missing?

References

Chapter 7 ASIC Manufacturing

I. Standard Product Circuit Design

II. ASIC Design for Manufacturability

III. Mask Making

IV. Wafer Fabrication

V. Testing

VI. Assembly and Package Technology

VII. Material and Inventory Management

VIII. Emerging Technologies

Chapter 8 Test and Testability of ASICs

I. Introduction

II. The Test Cycle

III. Problems in Testing

IV. Test Solutions

V. Test Trends

VI. Conclusions

References

Chapter 9 Electronic Packaging for ASICs

I. Introduction

II. Packaging Considerations When Using ASICs

III. The Problems of Single-Chip Packaging and the Promise of Multichip Modules

IV. Conclusion and Summary

Bibliography

Chapter 10 Application and Selection of ASICs

I. Identification of Potential Applications

II. Technology

III. Foundry versus the Turnkey Solution

Bibliography

Chapter 11 Designing with ASICs

I. Introduction

II. An Overview of the ASIC Design Process

III. Making the ASIC Decision

IV. Facilitating the ASIC Design

V. Design Methodology

VI. ASIC Implementation

VII. Summary

References

Chapter 12 Quality and Reliability

I. Introduction: Trends in Quality and Reliability

II. Wafer Fabrication

III. Packaging

IV. Some Statistical Background of QA/QC and Reliability

References

Index