Analytical Techniques for the Characterization of Compound Semiconductors

(Abbreviated.) Review Papers. Study of strain variation in LEC-grown GaAs bulk crystals by synchrotron radiation X-ray topography (J. Matsui). Multicrystal X-ray diffraction of heteroepitaxial structures (P.F. Fewster). Transmission electron microscopy of heteroepitaxial layer structures (H. Cerva). Control of MBE, MOMBE and CBE growth using RHEED (C.T. Foxon). Soft X-ray photoelectron spectroscopy of compound semiconductor surfaces and interfaces (I.T. McGovern). Secondary ion mass spectrometry of dopants and impurities in compound semiconductors: depth profiling of homo- and heterostructure (C. Grattepain, A.M. Huber). Electrical and optical defect spectroscopy of compound semiconductors (H.G. Grimmeiss, M. Kelverman). Subpicosecond luminescence spectroscopy of heterostructures (B. Deveaud). Far-infrared spectroscopy of impurities in semiconductors (R.A. Stradling). Micro-Raman spectroscopy for characterization of semiconductor devices (G. Abstreiter). Raman spectroscopy for impurity characterization in III-V semiconductors (J. Wagner). Techniques for Structural and Compositional Characterization. Modelling interdiffusion in epitaxial multilayer structures using X-ray simulation techniques (J.H.C. Hogg et al.). Ultrahigh resolution characterisation of compound semiconductors using pulsed laser atom probe techniques (R.A.D. Mackenzie et al.). Optical Characterization. A study of structural properties of bulk double-doped InP by laser scattering tomography and photoetching (R. Fornari et al .). Single-beam thermowave analysis of semiconductors (M. Wagner et al.). Electrical Characterization. Microscopic defect level characterization of semi-insulating compound semiconductors by TSC and PICTS. Application to the effect of hydrogen in CdTe (M. Hage-Ali et al.). An investigation of metal/GaAs(100) interfaces by deep level transient spectroscopy (L. Roberts, G. Hughes). Multi-Technique Applications. GaSb/GaAs heteroepitaxy characterized as a stress-free system (C. Raisin et al.). Comparison of pyrite thin films obtained from Fe and natural pyrite powder (C. De las Heras et al.). Author index. Subject index.