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- Future Contributions
- Chapter One: Energy Analysis of Charged Particle Flows
- 1 Basic Parameters
- 2 Main Types of Energy Analyzers
- 3 Advanced Energy Analyzers
- Chapter Two: Analytical Design Methods
- 1 Focusing Properties of Electrostatic Mirrors with Ideal Cylindrical Fields
- 2 Focusing Properties of Electrostatic Mirrors with Ideal Hyperbolic Fields
- Chapter Three: Approximate-Analytical Method of Calculating the Charged Particle Trajectories in Electrostatic Fields
- 1 Integro-Differential Equation of Charged Particle Trajectories in the Electrostatic Hexapole-Cylindrical Field U(r,z) = lnr + γUh(r,z)
- 2 Calculation of Charged Particle Trajectories in the Electrostatic Hexapole-Cylindrical Field U(r,z) = lnr + γUh(r,z)
- 3 Electron-Optical Properties of the Hexapole-Cylindrical Energy Analyzer with End-Face Electrodes (γ = − 1)
- 4 Electron-Optical Properties of the Hexapole-Cylindrical Energy Analyzer with γ = 1
- 5 Analysis of Electron-Optical Characteristics of the Energy Analyzer with the Field Distribution U (r,z) = lnr−Uh (r,z)
- Chapter Four: Numerical Methods in the Design of Energy Analyzers
- 1 Methods for Numerical Simulation of Electrostatic Fields
- 2 Main Approaches to Solving the Problems of Potential Theory Using BEM
- 3 General Techniques for Calculating the Integrals of Functions with Singularities
- 4 Using BEM to Solve the Interior Dirichlet Problem
- 5 Exterior Dirichlet Problem and Calculating the Integrals of Functions with Singularities
- 6 Numerical Calculation of Potential Gradient
- 7 Trajectory Analysis Techniques in Corpuscular-Optical Systems
- 8 Correlation Method for Seeking the Conditions of Higher-Order Angular Focusing
- 9 Examples of Numerical Simulation of Energy Analyzers
- Appendix 1 Some Intermediate Mathematical Calculations Relevant to Chapter 3
- Appendix 2 The Relationship Between the Output Parameters of the Energy Analyzers Considered in Chapter 3 and Initial and Boundary Conditions in Different Modes
- Appendix 3 Boundary Element Method (BEM) for Calculating the Potential and Its Gradient in Planar Systems
- Contents of Volumes 151-191
- Analytical, Approximate-Analytical, and Numerical Methods for Design of Energy Analyzers
- Brief Annotation
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
- No. of pages:
- © Academic Press 2015
- 22nd October 2015
- Academic Press
- Hardcover ISBN:
- eBook ISBN:
Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.
In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.
In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.
He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France
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