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Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers
1st Edition, Volume 192 - October 22, 2015
Editor: Peter W. Hawkes
Language: English
Hardback ISBN:9780128022528
9 7 8 - 0 - 1 2 - 8 0 2 2 5 2 - 8
eBook ISBN:9780128025185
9 7 8 - 0 - 1 2 - 8 0 2 5 1 8 - 5
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The ser…Read more
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merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on all the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Foreword
Preface
Future Contributions
Chapter One: Energy Analysis of Charged Particle Flows
Abstract
1 Basic Parameters
2 Main Types of Energy Analyzers
3 Advanced Energy Analyzers
Chapter Two: Analytical Design Methods
Abstract
1 Focusing Properties of Electrostatic Mirrors with Ideal Cylindrical Fields
2 Focusing Properties of Electrostatic Mirrors with Ideal Hyperbolic Fields
Chapter Three: Approximate-Analytical Method of Calculating the Charged Particle Trajectories in Electrostatic Fields
Abstract
1 Integro-Differential Equation of Charged Particle Trajectories in the Electrostatic Hexapole-Cylindrical Field U(r,z) = lnr + γUh(r,z)
2 Calculation of Charged Particle Trajectories in the Electrostatic Hexapole-Cylindrical Field U(r,z) = lnr + γUh(r,z)
3 Electron-Optical Properties of the Hexapole-Cylindrical Energy Analyzer with End-Face Electrodes (γ = − 1)
4 Electron-Optical Properties of the Hexapole-Cylindrical Energy Analyzer with γ = 1
5 Analysis of Electron-Optical Characteristics of the Energy Analyzer with the Field Distribution U (r,z) = lnr−Uh (r,z)
Chapter Four: Numerical Methods in the Design of Energy Analyzers
Abstract
1 Methods for Numerical Simulation of Electrostatic Fields
2 Main Approaches to Solving the Problems of Potential Theory Using BEM
3 General Techniques for Calculating the Integrals of Functions with Singularities
4 Using BEM to Solve the Interior Dirichlet Problem
5 Exterior Dirichlet Problem and Calculating the Integrals of Functions with Singularities
6 Numerical Calculation of Potential Gradient
7 Trajectory Analysis Techniques in Corpuscular-Optical Systems
8 Correlation Method for Seeking the Conditions of Higher-Order Angular Focusing
9 Examples of Numerical Simulation of Energy Analyzers
Appendices
Appendix 1 Some Intermediate Mathematical Calculations Relevant to Chapter 3
Appendix 2 The Relationship Between the Output Parameters of the Energy Analyzers Considered in Chapter 3 and Initial and Boundary Conditions in Different Modes
Appendix 3 Boundary Element Method (BEM) for Calculating the Potential and Its Gradient in Planar Systems
References
Contents of Volumes 151-191
Index
Analytical, Approximate-Analytical, and Numerical Methods for Design of Energy Analyzers
Brief Annotation
No. of pages: 224
Language: English
Edition: 1
Volume: 192
Published: October 22, 2015
Imprint: Academic Press
Hardback ISBN: 9780128022528
eBook ISBN: 9780128025185
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
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