G. Mollenstedt, The Invention of the Electron Fresnal Interference Biprism. H. Lichte, Electron Image Plane Off-Axis Holography of Atom Structures. P. Kruit, Magnetic Through-the-Lens Detection in Electron Microscopy and Spectroscopy, Part I. L. Dubbeldam, Advances in Voltage Contrast Detectors in Scanning Electron Microscopes. D.W. Pohl, Scanning Near-Field Optical Microscopy (SNOM). J. Hartikuinen, J. Jaarinen, and M. Luukkala, Microscopic Thermal Wave Non-destructive Testing.
The volumes in this series cover the progress and innovation in optical and electron microscopy at a fundamental level. It is aimed at microscopists and researchers not only interested in microscope instrumentation but also in applications ranging from biological techniques to materials research and industrial inspection.
Microscopists, applied physicists, metallurgists, materials scientists, and electrical and electronic engineers.
- No. of pages:
- © Academic Press 1991
- 14th December 1990
- Academic Press
- eBook ISBN:
The University of Sydney, Australia