Advances in Optical and Electron Microscopy

Advances in Optical and Electron Microscopy

First published on January 28, 1989

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  • Editors: T Mulvey, C. J. R. Sheppard
  • eBook ISBN: 9781483282244

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Description

Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy. This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging. This publication is a beneficial to students and individuals researching on optical and electron microscopy.

Table of Contents


  • Contributors

    Preface

    Instrumentation and Operation for High-Resolution Electron Microscopy

    I. Introduction

    II. Instrumentation

    A. The Electron Source

    B. Electron Lenses

    C. Specimen Stages

    D. Viewing and Recording Systems

    E. Complete Systems

    III. Image Formation

    A. Transfer Theory and Envelope Functions

    B. Definitions of Resolution

    C. Weak Phase Objects

    D. Multi-Slice Simulations and Thicker Materials

    IV. Imaging Modes

    A. Axial-Illumination Bright-Field

    B. Tilted-Illumination Bright-Field

    C. Tilted-Illumination Dark-Field

    D. Hollow-Cone

    V. Important Parameters

    A. Image Magnification

    B. Diffraction Pattern and Camera Length

    C. Crystal Alignment

    D. Incident Beam Alignment

    E. Objective Lens Focus

    F. Spherical Aberration

    G. Objective Lens Astigmatism

    H. Spread of Focus

    I. Illumination Angle

    VI. Concurrent Developments

    A. Scanning Transmission Electron Microscopy

    B. Convergent Beam and Micro-Diffraction

    C. Microanalysis

    D. Ultrahigh Vacuum

    E. On-Line Image Processing

    F. Radiation Damage

    VII. Conclusion

    References

    Electron Microscopy of Surface Structure

    I. History of Surface Imaging by Conventional Transmission Electron Microscopy

    II. Ultrahigh-Vacuum Electron Microscope Techniques for Surface Studies

    A. Ultrahigh-Vacuum Conditions

    B. In Situ Specimen Treatment Facilities

    C. Specimen Holders

    D. Analytical Equipment

    E. Image Recording Systems

    III. Characteristics of Observations and Results

    A. Transmission Electron Microscopy (TEM) and Transmission Electron Diffraction (TED)

    B. Reflection Electron Microscopy (REM) and Reflection High-Energy Electron Diffraction (RHEED)

    IV. Summary and Concluding Remarks

    References

    Notes Added in Proof

    Ion Probe Microscopy

    I. Introduction

    A. Physical Background

    B. General Experimental Arrangement

    II. Ion Sources

    A. Plasma Sources

    B. Surface Ionization Sources

    C. Field Ion Sources

    III. Mass Separation of Primary Ions

    IV. Secondary Ion Mass Spectrometry with High Lateral Resolution

    A. Ion Emission Microscopy

    B. Ion Microprobes

    V. Secondary Ion Collection

    A. Correlation between Sample Consumption and Sensitivity

    B. Transmission in Ion Microscopy

    C. Transmission in Ion Microprobes

    VI. Applications

    VII. Conclusion

    References

    Acoustic Microscopy

    I. Introduction

    II. Principle of Operation

    III. Imaging Modes

    IV. Quantitative Methods

    V. Biological Applications and Near-Surface Imaging of Solids

    VI. Interior Imaging

    VII. Towards Higher Resolution

    VIII. Conclusion

    Acknowledgments

    References

    Appendix

    Index

Product details

  • No. of pages: 198
  • Language: English
  • Copyright: © Academic Press 1989
  • Published: January 28, 1989
  • Imprint: Academic Press
  • eBook ISBN: 9781483282244

About the Editors

T Mulvey

C. J. R. Sheppard

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