Advances in Optical and Electron Microscopy - 1st Edition - ISBN: 9780120299119, 9781483282244

Advances in Optical and Electron Microscopy, Volume 11

1st Edition

Editors: T Mulvey C. J. R. Sheppard
eBook ISBN: 9781483282244
Imprint: Academic Press
Published Date: 28th January 1989
Page Count: 198
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Table of Contents

Contributors Preface Instrumentation and Operation for High-Resolution Electron Microscopy I. Introduction II. Instrumentation A. The Electron Source B. Electron Lenses C. Specimen Stages D. Viewing and Recording Systems E. Complete Systems III. Image Formation A. Transfer Theory and Envelope Functions B. Definitions of Resolution C. Weak Phase Objects D. Multi-Slice Simulations and Thicker Materials IV. Imaging Modes A. Axial-Illumination Bright-Field B. Tilted-Illumination Bright-Field C. Tilted-Illumination Dark-Field D. Hollow-Cone V. Important Parameters A. Image Magnification B. Diffraction Pattern and Camera Length C. Crystal Alignment D. Incident Beam Alignment E. Objective Lens Focus F. Spherical Aberration G. Objective Lens Astigmatism H. Spread of Focus I. Illumination Angle VI. Concurrent Developments A. Scanning Transmission Electron Microscopy B. Convergent Beam and Micro-Diffraction C. Microanalysis D. Ultrahigh Vacuum E. On-Line Image Processing F. Radiation Damage VII. Conclusion References Electron Microscopy of Surface Structure I. History of Surface Imaging by Conventional Transmission Electron Microscopy II. Ultrahigh-Vacuum Electron Microscope Techniques for Surface Studies A. Ultrahigh-Vacuum Conditions B. In Situ Specimen Treatment Facilities C. Specimen Holders D. Analytical Equipment E. Image Recording Systems III. Characteristics of Observations and Results A. Transmission Electron Microscopy (TEM) and Transmission Electron Diffraction (TED) B. Reflection Electron Microscopy (REM) and Reflecti


Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy. This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging. This publication is a beneficial to students and individuals researching on optical and electron microscopy.


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© Academic Press 1989
Academic Press
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About the Editors

T Mulvey Editor

C. J. R. Sheppard Editor