Advances in Imaging and Electron Physics, Volume 129

1st Edition

Calculus of Finite Differences in Quantum Electrodynamics

Authors: Beate Meffert Henning Harmuth
Series Editors: Peter Hawkes
Hardcover ISBN: 9780120147717
eBook ISBN: 9780080490083
Imprint: Academic Press
Published Date: 25th November 2003
Page Count: 312
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Description

Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. In particular, the early work of H.F. Harmuth on Maxwell's equations, which was highly controversial at the time, formed a supplement to the series

This volume, unlike previous volumes in the series concentrates solely on the research of professors' Harmuth and Meffert.

These studies raise important and fundamental questions concerning some of the basic areas of physics: electromagnetic theory and quantum mechanics. They deserve careful study and reflection for although the authors do not attempt to provide the definitive answer to the questions, their work is undoubtedly a major step towards such an answer. This volume essential reading for those researchers and academics working applied mathematicians or theoretical physics

Key Features

Unlike previous volumes, this book concentrates solely on the new research of professors Harmuth and Meffert

Raises important and fundamental questions concerning electromagnetism theory and quantum mechanics

Provides the steps in finding answers for the highly debated questions

Readership

Researchers, academics, physicists and engineers working in the field of image and electron physics or applied mathematicians


Details

No. of pages:
312
Language:
English
Copyright:
© Academic Press 2003
Published:
Imprint:
Academic Press
eBook ISBN:
9780080490083
Hardcover ISBN:
9780120147717

About the Authors

Beate Meffert Author

Affiliations and Expertise

Humboldt University, Berlin, Germany

Henning Harmuth Author

Affiliations and Expertise

Retired, The Catholic University of America, Washington, DC, USA

About the Series Editors

Peter Hawkes Series Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also partic

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France