Advances in Imaging and Electron Physics, Volume 114

1st Edition

Serial Volume Editors: Benjamin Kazan Tom Mulvey
Hardcover ISBN: 9780120147564
eBook ISBN: 9780080526195
Imprint: Academic Press
Published Date: 2nd June 2000
Page Count: 333
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Description

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.


Details

No. of pages:
333
Language:
English
Copyright:
© Academic Press 2000
Published:
Imprint:
Academic Press
eBook ISBN:
9780080526195
Hardcover ISBN:
9780120147564

Reviews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf." --MRS BULLETIN "With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE


About the Serial Volume Editors

Benjamin Kazan Serial Volume Editor

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

Tom Mulvey Serial Volume Editor

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.