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Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780120147489, 9780080577722

Advances in Imaging and Electron Physics, Volume 106

1st Edition

Editor in Chief: Peter Hawkes
Serial Editors: Benjamin Kazan Tom Mulvey
eBook ISBN: 9780080577722
Imprint: Academic Press
Published Date: 18th February 1999
Page Count: 353
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Table of Contents

M.J. Deen, T.D. Hardy, and R. Murowinski, Effects of Radiation Damage on Scientific Charge Coupled Devices. C.M. Krowne, CAD Using Green's Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators. S. Marchard-Maillet and S. Antipolis, Discrete Geometry to Image Processing. H. Ozaktas, M.A. Kutay, and D. Mendlovi, Introduction to the Fractional Fourier Transform and Its Applications. E.H.K. Stelzer and F.M. Haar, Confocal Microscopy. Subject Index.


Description

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.


Details

No. of pages:
353
Language:
English
Copyright:
© Academic Press 1999
Published:
18th February 1999
Imprint:
Academic Press
eBook ISBN:
9780080577722

Reviews

@from:Praise for the Series
@qu:"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
@source:--MRS BULLETIN
@qu:"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
@source:--J.A. CHAPMAN in LABORATORY PRACTICE

Ratings and Reviews


About the Editor in Chief

Peter Hawkes

Peter Hawkes

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)

About the Serial Editors

Benjamin Kazan

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

Tom Mulvey

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.