Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780123742070, 9780080556833

Advances in Imaging and Electron Physics, Volume 149

1st Edition

Electron Emission Physics

eBook ISBN: 9780080556833
Hardcover ISBN: 9780123742070
Imprint: Academic Press
Published Date: 26th November 2007
Page Count: 360
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Table of Contents

I. FIELD AND THERMIONIC EMISSION FUNDAMENTALS A. A Note On Units B. Free Electron Gas C. Nearly Free Electron Gas D. The Surface Barrier to Electron Emission E. The Image Charge Approximation II. THERMAL AND FIELD EMISSION A. Current Density B. Exactly Solvable Models C. WKB “Area Under the Curve” Models D. Numerical Methods E. The Thermal and Field Emission Equation F. The Revised FN-RLD Equation and the inference of Work Function from experimental data G. Recent Revisions of the Standard Thermal an Field Models H. The General Thermal-Field Equation I. Thermal Emittance III. PHOTOEMISSION A. Background B. Quantum Efficiency C. The Probability of emission D. Reflection and Penetration Depth E. Conductivity F. Scattering Rates G. Scattering factor H. Temperature of a Laser-illuminated Surface I. Numerical Solution of the Coupled Thermal Equations J. Revisions to the Modified Fowler Dubridge Model: Quantum Effects K. Quantum Efficiency Revisited: A Moments-based Approach L. The Quantum Efficiency of Bare Metals M. The Emittance and Brightness of Photocathodes IV. LOW WORK FUNCTION COATINGS AND ENHANCED EMISSION A. Some History B. A Simple Model of a Low Work Function Coating C. A Less Simple Model of the Low Work Function Coating D. The (Modified) Gyftopoulos-Levine Model of Work Function Reduction E. Comparison of the Modified Gyftopoulos-Levine Model to Thermionic Data F. Comparison of the Modified Gyftopoulos-Levine Model to Photoemission Data V. APPENDICES A. Integrals related to Fermi-Dirac and Bose-Einstein Statistics B. The Riemann Zeta function


Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


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© Academic Press 2007
Academic Press
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