Advances in Imaging and Electron Physics
Computer Techniques for Image Processing in Electron Microscopy
Free Global Shipping
No minimum orderDescription
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.
Key Features
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
Readership
Physicists, astronomers and engineers studying inverse imaging problems, digital image processing, aberration correction, ptychography and electron crystallography
Table of Contents
1. Image formation theory
W. Owen Saxton
2. The discrete Fourier transform
W. Owen Saxton
3. Analytic images
W. Owen Saxton
4. The image and diffraction plane problem: uniqueness
W. Owen Saxton
5. The image and diffraction plane problem: numerical methods
W. Owen Saxton
6. The image and diffraction plane problem: computational trials
W. Owen Saxton
7. Alternative data for the phase determination
W. Owen Saxton
8. The hardware of digital image handling
W. Owen Saxton
9. Basic software for digital image handling
W. Owen Saxton
10. Improc
W. Owen Saxton
Product details
- No. of pages: 328
- Language: English
- Copyright: © Academic Press 2020
- Published: May 21, 2020
- Imprint: Academic Press
- eBook ISBN: 9780128210000
- Hardcover ISBN: 9780128209998
About the Serial Editors
Martin Hÿtch
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and Expertise
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France
Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and Expertise
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France
Ratings and Reviews
There are currently no reviews for "Advances in Imaging and Electron Physics"