Advances in Imaging and Electron Physics, Volume 210

1. Introduction to the Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for Use in Electronic Transport Devices
Clifford M. Krowne
2. Determination of Reciprocal Lattice from Direct Space in 3D and 2D
Clifford M. Krowne
3. Tight-Binding Formulation of Electronic Band Structure of Hexagonal Materials
Clifford M. Krowne
4. Evaluation of the Matrix Elements for the Tight-Binding Formulation of Hexagonal Materials
Clifford M. Krowne
5. Solving the Secular Equation of the System for Eigenenergy
Clifford M. Krowne
6. Properties of the Bare Shifted Eigenenergy Determined as a Function of k Vector
Clifford M. Krowne
7. Hamiltonian of the Two Atom Sublattice System
Clifford M. Krowne
8. 2-Spinor and 4-Spinor Wavefunctions and Hamiltonians
Clifford M. Krowne
9. Examination of the Relativistic Dirac Equation and Its Implications
Clifford M. Krowne
10. Different Onsite Energies for the Two Atom Problem
Clifford M. Krowne
11. Overall Conclusion
Clifford M. Krowne
12. Performing EELS at Higher Energy Losses at Both 80 and 200 kV
Ian MacLaren, Rebecca B. Cummings, Fraser Gordon, Enrique Frutos-Myro, Sam McFadzean, Andy Brown, and Alan Craven

Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more.

• Contains contributions from leading authorities on the subject matter
• Informs and updates on the latest developments in the field of imaging and electron physics
• Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
• Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general