COVID-19 Update: We are currently shipping orders daily. However, due to transit disruptions in some geographies, deliveries may be delayed. To provide all customers with timely access to content, we are offering 50% off Science and Technology Print & eBook bundle options. Terms & conditions.
Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780128152164, 9780128155424

Advances in Imaging and Electron Physics, Volume 206

1st Edition

Serial Editor: Peter Hawkes
Hardcover ISBN: 9780128152164
eBook ISBN: 9780128155424
Imprint: Academic Press
Published Date: 15th June 2018
Page Count: 338
Sales tax will be calculated at check-out Price includes VAT/GST
342.68
175.00
169.00
245.00
208.25
Unavailable
Price includes VAT/GST

Institutional Subscription

Secure Checkout

Personal information is secured with SSL technology.

Free Shipping

Free global shipping
No minimum order.

Table of Contents

1. Holography and Tomography with Electrons
Axel Lubk
2. Paraxial Quantum Mechanics
Axel Lubk
3. Tomography
Axel Lubk
4. Electron Optics in Phase Space
Axel Lubk
5. Electron Holography in Phase Space
Axel Lubk
6. Electron Holographic Tomography
Axel Lubk
7. Summary and Outlook
Axel Lubk


Description

Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
338
Language:
English
Copyright:
© Academic Press 2018
Published:
15th June 2018
Imprint:
Academic Press
Hardcover ISBN:
9780128152164
eBook ISBN:
9780128155424

Awards

"The book is a very valuable addition to the literature in the field, and can be seen as a complete update to other existing works. I would recommend this book, especially to young researchers and newcomers in the field." -Optics and Photonics News

Ratings and Reviews


About the Serial Editor

Peter Hawkes

Peter Hawkes

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)