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Advances in Imaging and Electron Physics
1st Edition, Volume 204 - October 24, 2017
Editor: Peter W. Hawkes
Language: English
Hardback ISBN:9780128120866
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eBook ISBN:9780128121894
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Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy…Read more
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Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on all the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons, and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci
2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk
3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink
4. Energy Analysing and Energy Selecting Electron Microscopes A.J.F. Metherel
No. of pages: 248
Language: English
Edition: 1
Volume: 204
Published: October 24, 2017
Imprint: Academic Press
Hardback ISBN: 9780128120866
eBook ISBN: 9780128121894
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
Read Advances in Imaging and Electron Physics on ScienceDirect