Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - April 14, 2015

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  • Editor: Peter Hawkes
  • Hardcover ISBN: 9780128022542
  • eBook ISBN: 9780128025208

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Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

    • Preface
    • Future Contributions
    • Chapter One: Pattern Generators for Reflective Electron-Beam Lithography (REBL)
      • Abstract
      • 1 Introduction
      • 2 REBL and DPG Basics
      • 3 Lenslet Analysis
      • 4 REBL Patterning Strategy and Column Optics
      • 5 Charge Draining
      • 6 DPG2 Design and Realization
      • 7 Example of Lithographic Results
      • 8 Innovations in DPG3
      • 9 Summary
      • Acknowledgments
    • Chapter Two: Recent Developments in Time-of-Flight Mass Spectrometry
      • Abstract
      • 1 Introduction
      • 2 Recent Development in Time-of-Flight Mass Spectrometry
      • 3 Outlook
    • Chapter Three: A Special Voice Transform, Analytic Wavelets, and Zernike Functions
      • Abstract
      • 1 Introduction
      • 2 The Hyperbolic Wavelet Transform
      • 3 Multiresolution in the Hardy Space of the Unit Disk
      • 4 Multiresolution in the Hardy Space of the Upper Half-plane
      • 5 Connection Between the Voice Transform, Zernike Polynomials and Applications
      • Acknowledgments
    • Chapter Four: The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and Imaging
      • Abstract
      • 1 Introduction
      • 2 The nD case
      • 3 The 1D Case
      • 4 The 2D Case
      • 5 The 3D Case: The Spherically Symmetrical Fourier Transform
      • 6 The 4D Case
      • 7 The Projection-Slice Theorem
      • 8 Applications in Optical Diffraction and Imaging
      • 9 Conclusions
    • Contents of Volumes 151-187
    • Index

Product details

  • No. of pages: 232
  • Language: English
  • Copyright: © Academic Press 2015
  • Published: April 14, 2015
  • Imprint: Academic Press
  • Hardcover ISBN: 9780128022542
  • eBook ISBN: 9780128025208

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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