Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780128002650, 9780128003107

Advances in Imaging and Electron Physics, Volume 183

1st Edition

Serial Editors: Peter W. Hawkes
Hardcover ISBN: 9780128002650
eBook ISBN: 9780128003107
Imprint: Academic Press
Published Date: 1st April 2014
Page Count: 254
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Table of Contents

  • Editor-in-Chief
  • Preface
  • Future Contributions
  • Contributors
  • Chapter One. Toward Quantitative Scanning Electron Microscopy
    • 1. Introduction
    • 2. Low-Voltage Secondary Electron and Backscattered Electron Coefficients
    • 3. Secondary Electron Emission
    • 4. Monte Carlo Simulation of Backscattered Primary Electrons
    • 5. Results of the BSE Coefficient Measurements and Simulations
    • 6. Discussion of Backscattering Results
    • 7. Results of the Measurements and Calculations of the Secondary Electron Emission Coefficient, δ
    • 8. The Monte Carlo Simulation of Secondary Electron Emission
    • 9. The Influence of Errors in the Elastic and Inelastic Properties on the Monte Carlo Calculations
    • 10. Energy-Dispersive Spectroscopy
    • 11. Auger Electron Spectroscopy Experiments in SEM
    • 12. Doped Contrast
    • 13. Conclusions
  • Chapter Two. Logarithmic Wavelets
    • 1. Introduction
    • 2. Wavelet Origin and Basis
    • 3. History of the Logarithmic Image Processing (LIP) Model
    • 4. Logarithmic Wavelets
    • 5. Logarithmic Wavelet Applications
    • 6. Conclusion
    • 7. Main Notations
  • Chapter Three. 3-D Sparse Representations
    • 1. Introduction
    • 2. 3-D Wavelets
    • 3. 3-D Ridgelets and Beamlets
    • 4. First-Generation 3-D Curvelets
    • 5. Fast Curvelets
    • 6. Sparsity on the Sphere
    • 7. 3-D Wavelets on the Ball
  • Software
  • Contents of Volumes 151-182
  • Index
  • Color plates


Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


No. of pages:
© Academic Press 2014
1st April 2014
Academic Press
Hardcover ISBN:
eBook ISBN:

Ratings and Reviews

About the Serial Editors

Peter W. Hawkes

Peter W. Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France