Advances in Imaging and Electron Physics, Volume 183

1st Edition

Hardcover ISBN: 9780128002650
eBook ISBN: 9780128003107
Imprint: Academic Press
Published Date: 1st April 2014
Page Count: 254
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Table of Contents

  • Editor-in-Chief
  • Preface
  • Future Contributions
  • Contributors
  • Chapter One. Toward Quantitative Scanning Electron Microscopy
    • 1. Introduction
    • 2. Low-Voltage Secondary Electron and Backscattered Electron Coefficients
    • 3. Secondary Electron Emission
    • 4. Monte Carlo Simulation of Backscattered Primary Electrons
    • 5. Results of the BSE Coefficient Measurements and Simulations
    • 6. Discussion of Backscattering Results
    • 7. Results of the Measurements and Calculations of the Secondary Electron Emission Coefficient, δ
    • 8. The Monte Carlo Simulation of Secondary Electron Emission
    • 9. The Influence of Errors in the Elastic and Inelastic Properties on the Monte Carlo Calculations
    • 10. Energy-Dispersive Spectroscopy
    • 11. Auger Electron Spectroscopy Experiments in SEM
    • 12. Doped Contrast
    • 13. Conclusions
  • Chapter Two. Logarithmic Wavelets
    • 1. Introduction
    • 2. Wavelet Origin and Basis
    • 3. History of the Logarithmic Image Processing (LIP) Model
    • 4. Logarithmic Wavelets
    • 5. Logarithmic Wavelet Applications
    • 6. Conclusion
    • 7. Main Notations
  • Chapter Three. 3-D Sparse Representations
    • 1. Introduction
    • 2. 3-D Wavelets
    • 3. 3-D Ridgelets and Beamlets
    • 4. First-Generation 3-D Curvelets
    • 5. Fast Curvelets
    • 6. Sparsity on the Sphere
    • 7. 3-D Wavelets on the Ball
  • Software
  • Contents of Volumes 151-182
  • Index
  • Color plates

Description

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


Details

No. of pages:
254
Language:
English
Copyright:
© Academic Press 2014
Published:
Imprint:
Academic Press
eBook ISBN:
9780128003107
Hardcover ISBN:
9780128002650

Reviews

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.