Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780128002643, 9780128003077

Advances in Imaging and Electron Physics, Volume 186

1st Edition

Serial Editors: Peter Hawkes
eBook ISBN: 9780128003077
Hardcover ISBN: 9780128002643
Imprint: Academic Press
Published Date: 31st October 2014
Page Count: 182
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Table of Contents

  • Editor-In-Chief
  • Preface
  • Future Contributions
  • Chapter One. Practical Aspects of Transmission Electron Microscopy in Liquid
    • 1. Introduction
    • 2. Most Frequently Used Systems for Electron Microscopy of Liquid Specimens
    • 3. System Design Specifications
    • 4. Practical Aspects of Electron Microscopy in Liquid
    • 5. Conclusions
  • Chapter Two. Linear Canonical Transform
    • 1. Introduction
    • 2. Definitions of the Linear Canonical Transform
    • 3. Properties and Physical Meanings of the Linear Canonical Transform
    • 4. Operations Closely Related to the Linear Canonical Transform
    • 5. Digital Implementation and Discrete Versions of the Linear Canonical Transform
    • 6. Applications of the Linear Canonical Transform in Signal Processing
    • 7. Linear Canonical Transform for Electromagnetic Wave Propagation Analysis
    • 8. Two-Dimensional Versions of the Linear Canonical Transform
    • 9. Conclusion
  • Chapter Three. Mechanical, Electrostatic, and Electromagnetic Manipulation of Microobjects and Nanoobjects in Electron Microscopes
    • 1. Introduction
    • 2. Overview of Forces Acting on a Particle in an Electron Microscope
    • 3. Mechanical Manipulation
    • 4. Electrostatic Manipulation
    • 5. Electromagnetic Manipulation
    • 6. Conclusion
  • Contents of Volumes 151–185
    • Volume 151
    • Volume 152
    • Volume 153
    • Volume 154
    • Volume 155
    • Volume 156
    • Volume 157
    • Volume 158
    • Volume 159
    • Volume 160
    • Volume 161
    • Volume 162
    • Volume 163
    • Volume 164
    • Volume 165
    • Volume 166
    • Volume 167
    • Volume 168
    • Volume 169
    • Volume 170
    • Volume 171
    • Volume 172
    • Volume 173
    • Volume 174
    • Volume 175
    • Volume 176
    • Volume 177
    • Volume 178
    • Volume 179
    • Volume 180
    • Volume 181
    • Volume 182
    • Volume 183
    • Volume 184
    • Volume 185
  • Index
  • Color plate

Description

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


Details

No. of pages:
182
Language:
English
Copyright:
© Academic Press 2014
Published:
Imprint:
Academic Press
eBook ISBN:
9780128003077
Hardcover ISBN:
9780128002643

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France