Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - January 10, 2014

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  • Editor: Peter Hawkes
  • eBook ISBN: 9780128003190
  • Hardcover ISBN: 9780128000915

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

  • Editor-in-Chief


    Future Contributions


    1.   Octree Grid Topology-Preserving Geometric Deformable Model (OTGDM)

    1 Introduction

    2 Digital Topology on Adaptive Octree Grids

    3 OTGDM

    4 Experiments

    5 Summary and Discussion

    Appendix: Proof of Non-self-intersection of the Adaptive CCMC Algorithm


    2.    Second-order Variational Models for Image Texture Analysis

    1 Introduction

    2 First-order Variational Decomposition Models

    3 Second-order Models (2D Case)

    4 3D Second-order Models

    5 Examples and Applications

    Appendix A. Mathematical Tools

    Appendix B. 2D-MATLAB© Codes


    3.    Electron Microscopy of Pharmaceutical Systems

    1 Introduction

    2 Electron Microscopy (EM) of Solid Pharmaceutical Systems

    3 EM of Hydrated Pharmaceutical Systems

    4 Analytical Electron Microscopy of Pharmaceutical Systems

    5 Practical Application and Examples

    6 Conclusions



    Contents of Volumes 151––180


    Color Plates

Product details

  • No. of pages: 240
  • Language: English
  • Copyright: © Academic Press 2014
  • Published: January 10, 2014
  • Imprint: Academic Press
  • eBook ISBN: 9780128003190
  • Hardcover ISBN: 9780128000915

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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