Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

Editor-in-Chief

Preface

Future Contributions

Contributors

1.   Octree Grid Topology-Preserving Geometric Deformable Model (OTGDM)

1 Introduction

2 Digital Topology on Adaptive Octree Grids

3 OTGDM

4 Experiments

5 Summary and Discussion

Appendix: Proof of Non-self-intersection of the Adaptive CCMC Algorithm

References

2.    Second-order Variational Models for Image Texture Analysis

1 Introduction

2 First-order Variational Decomposition Models

3 Second-order Models (2D Case)

4 3D Second-order Models

5 Examples and Applications

Appendix A. Mathematical Tools

Appendix B. 2D-MATLAB© Codes

References

3.    Electron Microscopy of Pharmaceutical Systems

1 Introduction

2 Electron Microscopy (EM) of Solid Pharmaceutical Systems

3 EM of Hydrated Pharmaceutical Systems

4 Analytical Electron Microscopy of Pharmaceutical Systems

5 Practical Application and Examples

6 Conclusions

Acknowledgments

References

Contents of Volumes 151––180

Index

Color Plates

Details

No. of pages:
240
Language:
English
Copyright:
© 2014
Published:
Imprint:
Academic Press
eBook ISBN:
9780128003190
Print ISBN:
9780128000915