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Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780124077027, 9780124077300

Advances in Imaging and Electron Physics, Volume 177

1st Edition

Serial Editor: Peter Hawkes
eBook ISBN: 9780124077300
Hardcover ISBN: 9780124077027
Imprint: Academic Press
Published Date: 30th April 2013
Page Count: 380
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Table of Contents

Editor-In-Chief

Preface

Future Contributions

Contributors

Chapter One. Image Segmentation in the Field of the Logarithmic Image Processing Model: Special Focus on the Hierarchical Ascendant Classification Techniques

1 Introduction: Chapter Context and Aim

2 Multithresholding and K-Means

3 Region Growing

4 Hierarchical Ascendant Classification

5 Conclusion and Perspectives

6 Reflections on the LIP Model

References

Chapter Two. Representations for Morphological Image Operators and Analogies with Linear Operators

1 Introduction

2 Linear Spaces and Linear Image Operators

3 Lattice Spaces and Morphological Image Operators

4 Minimax Algebra and Image Operators on Complete Weighted Lattices

5 Kernel and Basis Representations of Operators on Lattices

6 Conclusions

References

Chapter Three. Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections

1 Early Years

2 Research with Professor Oatley

3 Research with Ellis Cosslett at the Cavendish Laboratory

4 Epilogue

References

Chapter Four. Advanced Methods of Electron Microscopy in Catalysis Research

1 Introduction

2 STEM and TEM

3 Examples of Applications to Catalyst Characterization

4 Electron Microscopy of Layered Materials

References

Color Plates

Index

Contents of Volumes 151-176


Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
380
Language:
English
Copyright:
© Academic Press 2013
Published:
30th April 2013
Imprint:
Academic Press
eBook ISBN:
9780124077300
Hardcover ISBN:
9780124077027

Ratings and Reviews


About the Serial Editor

Peter Hawkes

Peter Hawkes

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)