Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780124077010, 9780124077294

Advances in Imaging and Electron Physics, Volume 178

1st Edition

Serial Editors: Peter Hawkes
eBook ISBN: 9780124077294
Hardcover ISBN: 9780124077010
Imprint: Academic Press
Published Date: 25th June 2013
Page Count: 280
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Table of Contents



Future Contributions


Chapter One. Generalized Axiomatic Scale-Space Theory

1 Introduction

2 Image Measurements and the Notion of Scale

3 Structural Assumptions of Scale-Space Theory

4 Scale-Space Axioms for Spatial Image Domains

5 Scale-Space Concepts for Spatial Image Domains

6 Scale-Space Axioms for Spatiotemporal Image Domains

7 Scale-Space Concepts for Spatiotemporal Image Domains

8 Temporal Smoothing Kernels

9 History of Axiomatic Scale-Space Formulations

10 Summary and Conclusions



Chapter Two. Smoothlet Transform: Theory and Applications

1 Introduction

2 Smoothlets

3 Smoothlet Transform

4 Image Compression

5 Image Denoising

6 Summary


Chapter Three. Theory and Computation of Electron Mirrors: The Central Particle Method

1 Introduction

2 Systems with a Straight Optical Axis

3 Axially Symmetric Charged-Particle Optical Systems

4 Time-of-Flight Mass Spectrometer

5 Electron Microscope Objective with an Electron Mirror

6 Summary and Conclusions



Color Plates


Contents of Volumes 151-177


Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


No. of pages:
© Academic Press 2013
Academic Press
eBook ISBN:
Hardcover ISBN:

Ratings and Reviews

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He h

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France