Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780124077003, 9780124077287

Advances in Imaging and Electron Physics, Volume 179

1st Edition

Serial Editors: Peter Hawkes
eBook ISBN: 9780124077287
Hardcover ISBN: 9780124077003
Imprint: Academic Press
Published Date: 7th August 2013
Page Count: 410
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Table of Contents



Future Contributions


Chapter One. Invariant Quantum Wave Equations and Double Space-Time

1 Introduction

2 Dirac Equation

3 The Homogeneous Nonlinear Wave Equation

4 Invariance of Electromagnetic Laws

5 Electro-Weak and Electro-Strong Interactions

6 Other Consequences

7 Appendix A–Clifford Algebra

8 Appendix B–Calculations in Pauli Algebra



Chapter Two. In-Situ and Correlative Electron Microscopy: Proceedings of the Conference on In-Situ and Correlative Electron Microscopy (CISCEM), November 6–7, 2012, Saarbrücken, Germany


Session 1 Studying Carbon-Based Materials

Session 2 Correlative Fluorescence and Electron Microscopy

Session 3 Electron Microscopy of Biological Specimens in their Native Environment

Session 4 Imaging Growth of Nanomaterials in Liquid

Session 5 In-Situ Studies of Electronic Materials and Metals

Session 6 Studying Electrochemistry with Liquid Cell Electron Microscopy

Session 7 Poster Session


Chapter Three. Electron Tweezers as a Tool for High-Precision Manipulation of Nanoobjects

1 Introduction

2 Theoretical Models

3 Experimental Schemes

4 Plasmon Resonances and Electron Beam Trapping of Nanoparticles

5 Outlook and Future Directions



Chapter Four. Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy Images

1 Introduction

2 TS and FTS

3 Reduced TS and FTS Encodings

4 Performance of FTS versus TS

5 Conclusions



Chapter Five. Measure-by-Wire (MBW): An Automatic Control Framework for High-Throughput Transmission Electron Microscopy

1 Introduction

2 The Need for High-Throughput TEMs

3 The State of the Art in TEM Automation

4 A New TEM Paradigm: Measure-by-Wire

5 Examples of the MBW Approach

6 Conclusions


Appendix A Manual to Automated Operation Throughput Ratio

Appendix B Auto-Tuning Methods

Appendix C Estimation of the Second-Order Model Parameters


Contents of Volumes 151–178


Color Plates


Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


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© Academic Press 2013
Academic Press
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Ratings and Reviews

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France