Advances in Imaging and Electron Physics, Volume 179

1st Edition

Hardcover ISBN: 9780124077003
eBook ISBN: 9780124077287
Imprint: Academic Press
Published Date: 16th August 2013
Page Count: 410
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Table of Contents

Editor-in-Chief

Preface

Future Contributions

Contributors

Chapter One. Invariant Quantum Wave Equations and Double Space-Time

1 Introduction

2 Dirac Equation

3 The Homogeneous Nonlinear Wave Equation

4 Invariance of Electromagnetic Laws

5 Electro-Weak and Electro-Strong Interactions

6 Other Consequences

7 Appendix A–Clifford Algebra

8 Appendix B–Calculations in Pauli Algebra

Acknowledgments

References

Chapter Two. In-Situ and Correlative Electron Microscopy: Proceedings of the Conference on In-Situ and Correlative Electron Microscopy (CISCEM), November 6–7, 2012, Saarbrücken, Germany

Introduction

Session 1 Studying Carbon-Based Materials

Session 2 Correlative Fluorescence and Electron Microscopy

Session 3 Electron Microscopy of Biological Specimens in their Native Environment

Session 4 Imaging Growth of Nanomaterials in Liquid

Session 5 In-Situ Studies of Electronic Materials and Metals

Session 6 Studying Electrochemistry with Liquid Cell Electron Microscopy

Session 7 Poster Session

Acknowledgments

Chapter Three. Electron Tweezers as a Tool for High-Precision Manipulation of Nanoobjects

1 Introduction

2 Theoretical Models

3 Experimental Schemes

4 Plasmon Resonances and Electron Beam Trapping of Nanoparticles

5 Outlook and Future Directions

Acknowledgments

References

Chapter Four. Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy Images

1 Introduction

2 TS and FTS

3 Reduced TS and FTS Encodings

4 Performance of FTS versus TS

5 Conclusions

Acknowledgments

References

Chapter Five. Measure-by-Wire (MBW): An Automatic Control Framework for High-Throughput Transmi


Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


Details

No. of pages:
410
Language:
English
Copyright:
© Academic Press 2013
Published:
Imprint:
Academic Press
eBook ISBN:
9780124077287
Hardcover ISBN:
9780124077003

Reviews

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.