Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - December 2, 2012

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  • Editor: Peter Hawkes
  • eBook ISBN: 9780124077287
  • Hardcover ISBN: 9780124077003

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Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

  • Editor-in-Chief

    Preface

    Future Contributions

    Contributors

    Chapter One. Invariant Quantum Wave Equations and Double Space-Time

    1 Introduction

    2 Dirac Equation

    3 The Homogeneous Nonlinear Wave Equation

    4 Invariance of Electromagnetic Laws

    5 Electro-Weak and Electro-Strong Interactions

    6 Other Consequences

    7 Appendix A–Clifford Algebra

    8 Appendix B–Calculations in Pauli Algebra

    Acknowledgments

    References

    Chapter Two. In-Situ and Correlative Electron Microscopy: Proceedings of the Conference on In-Situ and Correlative Electron Microscopy (CISCEM), November 6–7, 2012, Saarbrücken, Germany

    Introduction

    Session 1 Studying Carbon-Based Materials

    Session 2 Correlative Fluorescence and Electron Microscopy

    Session 3 Electron Microscopy of Biological Specimens in their Native Environment

    Session 4 Imaging Growth of Nanomaterials in Liquid

    Session 5 In-Situ Studies of Electronic Materials and Metals

    Session 6 Studying Electrochemistry with Liquid Cell Electron Microscopy

    Session 7 Poster Session

    Acknowledgments

    Chapter Three. Electron Tweezers as a Tool for High-Precision Manipulation of Nanoobjects

    1 Introduction

    2 Theoretical Models

    3 Experimental Schemes

    4 Plasmon Resonances and Electron Beam Trapping of Nanoparticles

    5 Outlook and Future Directions

    Acknowledgments

    References

    Chapter Four. Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy Images

    1 Introduction

    2 TS and FTS

    3 Reduced TS and FTS Encodings

    4 Performance of FTS versus TS

    5 Conclusions

    Acknowledgments

    References

    Chapter Five. Measure-by-Wire (MBW): An Automatic Control Framework for High-Throughput Transmission Electron Microscopy

    1 Introduction

    2 The Need for High-Throughput TEMs

    3 The State of the Art in TEM Automation

    4 A New TEM Paradigm: Measure-by-Wire

    5 Examples of the MBW Approach

    6 Conclusions

    Acknowledgments

    Appendix A Manual to Automated Operation Throughput Ratio

    Appendix B Auto-Tuning Methods

    Appendix C Estimation of the Second-Order Model Parameters

    References

    Contents of Volumes 151–178

    Index

    Color Plates

Product details

  • No. of pages: 410
  • Language: English
  • Copyright: © Academic Press 2013
  • Published: December 2, 2012
  • Imprint: Academic Press
  • eBook ISBN: 9780124077287
  • Hardcover ISBN: 9780124077003

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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