Advances in Imaging and Electron Physics, Volume 175

1st Edition

Serial Editors: Peter Hawkes
Hardcover ISBN: 9780124076709
eBook ISBN: 9780124077973
Imprint: Academic Press
Published Date: 7th February 2013
Page Count: 360
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Table of Contents



Future Contributions


Chapter One. Small Angle Scatter with Correlation, Scatter and Intermediate Functions

1 Overview of Scatter: Neutron and X-ray Small-angle Scatter in Perspective

2 Neutron and X-ray Scatter Amplitude from Non–bravais Lattice Crystal

3 Neutron and X-ray Scatter Intensity from Non–Bravais Lattice Crystal

4 Small-angle Scatter: Scatter Length Density and Particle Structure Factor

5 Small-angle Scatter: Scatter Amplitudes and Intensity

6 The Rayleigh–Gans Equation, Babinet’s Principle, and Differential Cross Sections

7 Random Variables: Correlation and Independence

8 The Scattering Vector Resolution of SANS Instruments for Neutrons and X-rays

9 Macroscopic Differential Cross Section: Scatter Length Density Convolution and Correlation

10 The Pair Correlation Function

11 The Macroscopic Differential Cross Section for Elastic Scatter Expressed by Intermediate Function, and Fourier Transform of Patterson Function

12 Scatter Function for Elastic and Inelastic Scatter from Sample Solute Particles Obtained from Neutron (X-ray), Sample-Averaged Scatter Intensity

13 Sample-averaged Scatter Intensity Versus Scattering Vector q for the Guinier, Intermediate, and Porod Regimes

14 Small-angle Scatter: Measurement of Solute Particle Size and Shape—Guinier Regime

15 Small-angle Scatter from Spherical Particles—Guinier Regime

16 Small-angle Scatter from Particles of Various Shapes, Log-log Plots, Method of Contrast Variation—Guinier Regime

17 Small-angle Scatter—Intermediate Regime and Porod Regime

18 Small-angle Scatter—Porod Regime and Porod’s Law

19 Neutron Incoherent Scatter: Solution of the Diffusion Equation with Self-Correlation and Incoherent Scatter Functions, Me


Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


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About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also partic

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France