Advances in Imaging and Electron Physics, Volume 170

1st Edition

Hardcover ISBN: 9780123943965
eBook ISBN: 9780123978431
Imprint: Academic Press
Published Date: 27th January 2012
Page Count: 280
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Table of Contents

 Precession Electron Diffraction
1. Introduction
2. Precession Electron Diffraction: Geometry and Diffracted Intensities
3. Structure Solution Using Precession Electron Diffraction
4. Applications and New Developments of PED
5. Conclusions
Acknowledgments
Scanning Helium Ion Microscopy
1. Introduction
2. Scanning Helium Ion Microscope
3. Applications
4. Future Developments
5. Conclusion
Acknowledgments
Signal Reconstruction Algorithm Based on a Single Intensity in the Fresnel Domain
1. Introduction
2. Theory
3. The Recursive Algorithm
4. Numerical Results
5. Conclusions
Acknowledgments
Electron Microscopy Studies on Magnetic L10-Type FePd Nanoparticles
1. Introduction
2. Experimental Procedures
3. Atomic Ordering and Hard Magnetic Properties
4. Determination of Order Parameter by Electron Diffraction
5. Atomic Structure Imaging of Nanoparticles
6. 3D Shapes and Distribution of Nanoparticles
7. Concluding Remarks
Acknowledgments
Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy
1. Introduction
2. Instrumentation
3. Experimental Results
4. Lensless Focusing
5. Summary and Outlook
Acknowledgments

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
280
Language:
English
Copyright:
© Academic Press 2012
Published:
Imprint:
Academic Press
eBook ISBN:
9780123978431
Hardcover ISBN:
9780123943965