Advances in Imaging and Electron Physics, Volume 171

1st Edition

Serial Editors: Peter Hawkes
Hardcover ISBN: 9780123942975
eBook ISBN: 9780123946355
Imprint: Academic Press
Published Date: 15th May 2012
Page Count: 440
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Table of Contents

    1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
    2. G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

    3. Thermal Imaging in Medicine
    4. Lila Iznita Izhar and Maria Petrou

    5. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
    6. Jean-Michel Tualle

    7. Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications
    8. Kamlesh Shrivas and Mitsutoshi Setou

    9. Transformation Optics
    10. Robert T. Thompson and Steven A. Cummer

    11. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
    12. Tobias Klein, Egbert Buhr and Carl Georg Frase

    13. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah


Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
440
Language:
English
Copyright:
© Academic Press 2012
Published:
Imprint:
Academic Press
eBook ISBN:
9780123946355
Hardcover ISBN:
9780123942975

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also partic

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France