Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

Key features:

* Contributions from leading authorities
* Informs and updates on all the latest developments in the field


Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

    1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
    2. G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

    3. Thermal Imaging in Medicine
    4. Lila Iznita Izhar and Maria Petrou

    5. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
    6. Jean-Michel Tualle

    7. Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications
    8. Kamlesh Shrivas and Mitsutoshi Setou

    9. Transformation Optics
    10. Robert T. Thompson and Steven A. Cummer

    11. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
    12. Tobias Klein, Egbert Buhr and Carl Georg Frase

    13. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah

Details

No. of pages:
440
Language:
English
Copyright:
© 2012
Published:
Imprint:
Academic Press
Print ISBN:
9780123942975
Electronic ISBN:
9780123946355