Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780123859853, 9780123859860

Advances in Imaging and Electron Physics, Volume 167

1st Edition

Serial Editors: Peter W. Hawkes
Hardcover ISBN: 9780123859853
eBook ISBN: 9780123859860
Imprint: Academic Press
Published Date: 12th July 2011
Page Count: 360
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Table of Contents

  • A History of Cameca (1954–2009)
    • 1. Genealogy of Cameca
    • 2. From Radio-Cinéma to Cameca (1954)
    • 3. The MS46, First Microprobe Designed at Cameca (1964)
    • 4. Launching the SMI 300 (1968)
    • 5. The Adult Age (1975)
    • 6. Taking Wing (1987)
    • 7. Predominance of Sims (1990–2000)
    • 8. Star Dusts and Fab Dusts (2000)
    • 9. Ametek and the Atom Probe (2007)
    • 10. Epilogue
    • 11. Appendices
  • Theory and Applications of General Adaptive Neighborhood Image Processing
    • 1. Introduction
    • 2. Preliminaries of GANIP
    • 3. GAN-Based Mathematical Morphology
    • 4. GAN-Based Choquet Filtering
    • 5. GAN-Based Distance Transforms
    • 6. Application Issues
    • 7. Concluding Discussion and Perspectives
    • Acknowledgments
  • Shape Recognition Based on Eigenvalues of the Laplacian
    • 1. Introduction
    • 2. Related Work
    • 3. Eigenvalues of the Dirichlet and Neumann Laplacians
    • 4. The Clamped Plate and Buckling of a Clamped Plate Problems
    • 5. Lessons from Simple Shapes
    • 6. Computation of the Eigenvalues
    • 7. Features Based on the Eigenvalues of the Various Problems Considered
    • 8. Artificial Neural Networks
    • 9. Experimental Results
    • 10. Conclusion
    • Acknowledgments
  • Point Set Analysis
    • 1. Introduction
    • 2. Motivation, Related Issues, and Notations
    • 3. A New Spectrum of Shapes for UPS Analysis
    • 4. Applications of Mesh Morphological Operators
    • 5. Discussion
    • 6. Conclusions and Future Research
  • Image Recovery from Sparse Samples, Discrete Sampling Theorem, and Sharply Bounded Band-Limited Discrete Signals
    • 1. Introduction: Sparse Sampling
    • 2. Discrete Sampling Theorem
    • 3. Algorithms for Signal Recovery from Sparse Sampled Data
    • 4. Analysis of Transforms
    • 5. Selection of Transform for Image Band-Limited Approximation
    • 6. Application Examples
    • 7. Sharply Band-Limited Discrete Signals with Sharply Limited Support
    • 8. Conclusion


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


No. of pages:
© Academic Press 2011
12th July 2011
Academic Press
Hardcover ISBN:
eBook ISBN:

Ratings and Reviews

About the Serial Editors

Peter W. Hawkes

Peter W. Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France