Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  1. A History Of Cameca
  2. Emmanuel de Chambost

  3. Theory and Applications of General Adaptive Neighborhood Image Processing
  4. Johan Debayle, Jean-Charles Pinoli

  5. Shape Recognition Based on Eigenvalues of the Laplacian
  6. M. Ben Haj Rhouma, M.A. Khabou, L. Hermi

  7. Point Set Analysis
  8. Nicolas Lom´enie, Georges Stamon

  9. Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals

Leonid P. Yaroslavsky

Details

No. of pages:
360
Language:
English
Copyright:
© 2011
Published:
Imprint:
Academic Press
Print ISBN:
9780123859853
Electronic ISBN:
9780123859860