Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

1st Edition - July 20, 2011

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  • Editor: Peter Hawkes
  • Hardcover ISBN: 9780123859839
  • eBook ISBN: 9780123859846

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

    • Editor-in-Chief
    • Edited By
    • Preface
    • Contributors
    • Future Contributions
    • Chapter 1: The Synthesis of a Stochastic Artificial Neural Network Application Using a Genetic Algorithm Approach
      • 1 Introduction
      • 2 The Phenotype Representation
      • 3 The Genotype Representation
      • 4 A Genetic Approach
      • 5 Case Studies
      • 6 Conclusions
    • Chapter 2: Logarithmic Image Processing for Color Images
      • 1 Introduction
      • 2 Logarithmic Image Processing for Color Images
      • 3 Conclusion
    • Chapter 3: Current Technologies for High-Speed and Functional Imaging with Optical Coherence Tomography
      • 1 Introduction
      • 2 Basics
      • 3 High-Speed Imaging: Technology and Applications
      • 4 Functional Extensions
      • 5 Exogenous Contrast-Enhancement Techniques
      • 6 Outlook and Conclusion
    • Chapter 4: Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object’ s Surface in Mirror Electron Microscopy
      • 1 Introduction
      • 2 Geometrical Optics of the Mirror Electron Microscope
      • 3 Electron Trajectory in the Presence of Small Perturbations
      • 4 Measurement of Electric and Magnetic Fields in the Mirror Electron Microscope
      • 5 Conclusions
    • Chapter 5: Multivariate Statistics Applications in Scanning Transmission Electron Microscopy X-Ray Spectrum Imaging
      • 1 Introduction
      • 2 Recent Hardware Advances
      • 3 Multivariate Statistical Analysis
      • 4 Summary
    • Chapter 6: Aberration Correctors Developed Under the Triple C Project
      • 1 Introduction
      • 2 Delta Corrector
      • 3 Combination Concave Lens– Type Chromatic Aberration Corrector
      • 4 Summary
      • Appendices
    • Chapter 7: Spatially Resolved Thermoluminescence in a Scanning Electron Microscope
      • 1 Introduction
      • 2 Instrumentation
      • 3 Thermoluminescence Model
      • 4 Spatial Resolution of Thermoluminescence
      • 5 Demonstration
      • 6 Thermoluminescence Analysis and Related Methods
      • 7 Conclusions
    • Contents of Volumes 151– 167
    • Index

Product details

  • No. of pages: 392
  • Language: English
  • Copyright: © Academic Press 2011
  • Published: July 20, 2011
  • Imprint: Academic Press
  • Hardcover ISBN: 9780123859839
  • eBook ISBN: 9780123859846

About the Serial Editor

Peter Hawkes

Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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