Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  • Editor-in-Chief
  • Edited By
  • Preface
  • Contributors
  • Future Contributions
  • Chapter 1: The Synthesis of a Stochastic Artificial Neural Network Application Using a Genetic Algorithm Approach
    • 1 Introduction
    • 2 The Phenotype Representation
    • 3 The Genotype Representation
    • 4 A Genetic Approach
    • 5 Case Studies
    • 6 Conclusions
  • Chapter 2: Logarithmic Image Processing for Color Images
    • 1 Introduction
    • 2 Logarithmic Image Processing for Color Images
    • 3 Conclusion
  • Chapter 3: Current Technologies for High-Speed and Functional Imaging with Optical Coherence Tomography
    • 1 Introduction
    • 2 Basics
    • 3 High-Speed Imaging: Technology and Applications
    • 4 Functional Extensions
    • 5 Exogenous Contrast-Enhancement Techniques
    • 6 Outlook and Conclusion
  • Chapter 4: Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object’ s Surface in Mirror Electron Microscopy
    • 1 Introduction
    • 2 Geometrical Optics of the Mirror Electron Microscope
    • 3 Electron Trajectory in the Presence of Small Perturbations
    • 4 Measurement of Electric and Magnetic Fields in the Mirror Electron Microscope
    • 5 Conclusions
  • Chapter 5: Multivariate Statistics Applications in Scanning Transmission Electron Microscopy X-Ray Spectrum Imaging
    • 1 Introduction
    • 2 Recent Hardware Advances
    • 3 Multivariate Statistical Analysis
    • 4 Summary
  • Chapter 6: Aberration Correctors Developed Under the Triple C Project
    • 1 Introduction
    • 2 Delta Corrector
    • 3 Combination Concave Lens– Type Chromatic Aberration Corrector
    • 4 Summary
    • Appendices
  • Chapter 7: Spa

Details

No. of pages:
392
Language:
English
Copyright:
© 2011
Published:
Imprint:
Academic Press
eBook ISBN:
9780123859846
Print ISBN:
9780123859839