Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - October 19, 2011

Write a review

  • Editor: Peter Hawkes
  • Hardcover ISBN: 9780123859815
  • eBook ISBN: 9780123859822

Purchase options

Purchase options
DRM-free (EPub, Mobi, PDF)
Sales tax will be calculated at check-out

Institutional Subscription

Free Global Shipping
No minimum order


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  • Morphological Texture Description of Grey-Scale and Color Images

    1. Introduction

    2. Texture Description and Classification

    3. Basics of Mathematical Morphology

    4. Morphological Approaches to Texture Description

    5. Extension to Color

    6. Implementation Efficiency

    7. Applications

    8. Experiments

    9. Conclusion

    Electron Microscopy of Ultracold Gases

    1. Introduction

    2. Ultracold Atomic Gases

    3. Scanning Electron Microscopy Applied to Ultracold Gases

    4. Perspectives and Outlook

    Application of Artificial Intelligence Methods to Content-Based Image Retrieval

    1. Content-Based Image Retrieval Fundamentals

    2. Artificial Intelligence in Image Retrieval

    3. Optimizing the Retrieval Process via Artificial Ant Colonies

    4. Conclusions and Future Work

    Diffusion on a Tensor Product Graph for Semi-Supervised Learning and Interactive Image Segmentation

    1. Introduction

    2. Related Work

    3. The Diffusion Process

    4. Semi-Supervised Locally Constrained Diffusion Process

    5. Tensor Product Graph Diffusion

    6. Equivalence of SADP and TPDP

    7. SADP Algorithm

    8. Experimental Results

    9. Semi-Supervised Image Segmentation

    10. Interactive Segmentation

    11. Conclusion


    Electron Holography for Electric and Magnetic Field Measurements and Its Application for Nanophysics

    1. Introduction

    2. Experimental Scheme and Conditions of Interference

    3. Reconstruction of the Electric Field Distribution in the Space Near the Object

    4. Practical Applications of Measurements of Local Potentials

    5. Magnetic Measurements


Product details

  • No. of pages: 266
  • Language: English
  • Copyright: © Academic Press 2011
  • Published: October 19, 2011
  • Imprint: Academic Press
  • Hardcover ISBN: 9780123859815
  • eBook ISBN: 9780123859822

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

Ratings and Reviews

Write a review

There are currently no reviews for "Advances in Imaging and Electron Physics"