Advances in Imaging and Electron Physics, Volume 169

1st Edition

Serial Editors: Peter Hawkes
Hardcover ISBN: 9780123859815
eBook ISBN: 9780123859822
Imprint: Academic Press
Published Date: 11th November 2011
Page Count: 266
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Table of Contents

Morphological Texture Description of Grey-Scale and Color Images

1. Introduction

2. Texture Description and Classification

3. Basics of Mathematical Morphology

4. Morphological Approaches to Texture Description

5. Extension to Color

6. Implementation Efficiency

7. Applications

8. Experiments

9. Conclusion

Electron Microscopy of Ultracold Gases

1. Introduction

2. Ultracold Atomic Gases

3. Scanning Electron Microscopy Applied to Ultracold Gases

4. Perspectives and Outlook

Application of Artificial Intelligence Methods to Content-Based Image Retrieval

1. Content-Based Image Retrieval Fundamentals

2. Artificial Intelligence in Image Retrieval

3. Optimizing the Retrieval Process via Artificial Ant Colonies

4. Conclusions and Future Work

Diffusion on a Tensor Product Graph for Semi-Supervised Learning and Interactive Image Segmentation

1. Introduction

2. Related Work

3. The Diffusion Process

4. Semi-Supervised Locally Constrained Diffusion Process

5. Tensor Product Graph Diffusion

6. Equivalence of SADP and TPDP

7. SADP Algorithm

8. Experimental Results

9. Semi-Supervised Image Segmentation

10. Interactive Segmentation

11. Conclusion

Acknowledgment

Electron Holography for Electric and Magnetic Field Measurements and Its Application for Nanophysics

1. Introduction

2. Experimental Scheme and Conditions of Interference

3. Reconstruction of the Electric Field Distribution in the Space Near the Object

4. Practical Applications of Measurements of Local Potentials

5. Magnetic Measurements

Conclusions


Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
266
Language:
English
Copyright:
© Academic Press 2011
Published:
Imprint:
Academic Press
eBook ISBN:
9780123859822
Hardcover ISBN:
9780123859815

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also partic

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France