Secure CheckoutPersonal information is secured with SSL technology.
Free ShippingFree global shipping
No minimum order.
1. 2D Fourier Transforms in Polar Coordinates
2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagation
Neil V. Budko
3. Chromatic aberration correction - the next step in electron microscopy
Rowan Leary and Rik Brydson
4. Methods for vectorial analysis and imaging in high-resolution laser microscopy
5. Image Hierarchy in Gaussian Scale Space
Tomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya
6. The Theory of the Boundary Diffraction Wave
Yusuf Ziya Umul
7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction Measurements
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- No. of pages:
- © Academic Press 2011
- 14th February 2011
- Academic Press
- Hardcover ISBN:
- eBook ISBN:
- Paperback ISBN:
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)
Elsevier.com visitor survey
We are always looking for ways to improve customer experience on Elsevier.com.
We would like to ask you for a moment of your time to fill in a short questionnaire, at the end of your visit.
If you decide to participate, a new browser tab will open so you can complete the survey after you have completed your visit to this website.
Thanks in advance for your time.