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Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780123858610, 9780123858627

Advances in Imaging and Electron Physics, Volume 165

1st Edition

Serial Editor: Peter Hawkes
Hardcover ISBN: 9780123858610
eBook ISBN: 9780123858627
Paperback ISBN: 9780323164450
Imprint: Academic Press
Published Date: 14th February 2011
Page Count: 360
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Table of Contents

1. 2D Fourier Transforms in Polar Coordinates
Natalie Baddour
2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagation
Neil V. Budko
3. Chromatic aberration correction - the next step in electron microscopy
Rowan Leary and Rik Brydson
4. Methods for vectorial analysis and imaging in high-resolution laser microscopy
Michele Marrocco
5. Image Hierarchy in Gaussian Scale Space
Tomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya
6. The Theory of the Boundary Diffraction Wave
Yusuf Ziya Umul
7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction Measurements
Emil Wolf


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


No. of pages:
© Academic Press 2011
14th February 2011
Academic Press
Hardcover ISBN:
eBook ISBN:
Paperback ISBN:

Ratings and Reviews

About the Serial Editor

Peter Hawkes

Peter Hawkes

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)