Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  1. 2D Fourier Transforms in Polar Coordinates
  2. Natalie Baddour

  3. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagation
  4. Neil V. Budko

  5. Chromatic aberration correction - the next step in electron microscopy
  6. Rowan Leary and Rik Brydson

  7. Methods for vectorial analysis and imaging in high-resolution laser microscopy
  8. Michele Marrocco

  9. Image Hierarchy in Gaussian Scale Space
  10. Tomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya

  11. The Theory of the Boundary Diffraction Wave
  12. Yusuf Ziya Umul

  13. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction Measurements

Emil Wolf


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© 2011
Academic Press
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