Advances in Imaging and Electron Physics, Volume 162

1st Edition

Optics of Charged Particle Analyzers

Hardcover ISBN: 9780123813169
eBook ISBN: 9780123813176
Imprint: Academic Press
Published Date: 30th June 2010
Page Count: 296
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Table of Contents

1. Energy Filtered X-ray Photoemission electron
microscopy(EXPEEM)
- Kiyotaka Asakura

2. Image contrast in aberration-corrected scanning
confocal electron microscopy
- E.C. Cosgriff

3. Comparison of color demosaicing methods
- O. Lossona

4. New dimensions for field emission: effects of structure in the emitting surface
- C. J. Edgcombe

5. Conductivity Imaging and Generalised Radon
Transform: a review
- Archontis Giannakidis

6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy
- A. Sever Škapin


Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
296
Language:
English
Copyright:
© Academic Press 2010
Published:
Imprint:
Academic Press
eBook ISBN:
9780123813176
Hardcover ISBN:
9780123813169