Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

1st Edition - June 30, 2010

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  • Editor: Peter Hawkes
  • eBook ISBN: 9780123813176
  • Hardcover ISBN: 9780123813169

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  • 1. Energy Filtered X-ray Photoemission electron
    - Kiyotaka Asakura

    2. Image contrast in aberration-corrected scanning
    confocal electron microscopy
    - E.C. Cosgriff

    3. Comparison of color demosaicing methods
    - O. Lossona

    4. New dimensions for field emission: effects of structure in the emitting surface
    - C. J. Edgcombe

    5. Conductivity Imaging and Generalised Radon
    Transform: a review
    - Archontis Giannakidis

    6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy
    - A. Sever Škapin

Product details

  • No. of pages: 296
  • Language: English
  • Copyright: © Academic Press 2010
  • Published: June 30, 2010
  • Imprint: Academic Press
  • eBook ISBN: 9780123813176
  • Hardcover ISBN: 9780123813169

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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