Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

1st Edition - July 15, 2009

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  • Editor: Peter Hawkes
  • eBook ISBN: 9780080912165
  • Hardcover ISBN: 9780123747686

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Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  • 1. Charged particles in electromagnetic fields

    2. Language of aberration expansions in charged particle optics

    3. Transporting charged particle beams in static fields

    4. Transporting charged particles in radiofrequency fields

    5. Static magnetic charged particle analyzers

    6. Electrostatic energy analyzers

    7. Mass analyzers with combined electrostatic and magnetic fields

    8. Time-of-flight mass analyzers

    9. Radiofrequency mass analyzers

Product details

  • No. of pages: 373
  • Language: English
  • Copyright: © Academic Press 2009
  • Published: July 15, 2009
  • Imprint: Academic Press
  • eBook ISBN: 9780080912165
  • Hardcover ISBN: 9780123747686

About the Serial Editor

Peter Hawkes

Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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