Advances in Imaging and Electron Physics, Volume 155

1st Edition

Selected Problems of Computational Charged Particle Optics

Authors: Dmitry Greenfield Mikhael Monastyrskii
Hardcover ISBN: 9780123747174
eBook ISBN: 9780080879697
Imprint: Academic Press
Published Date: 29th December 2008
Page Count: 364
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Table of Contents

Chapter 1. Integral equations method in electrostatics 1.1. Statement of the problem 1.2. Boundary surface approximation 1.3. Surface charge density approximation 1.4. Interface boundary conditions for dielectric materials 1.5 Reducing the integral equations to the finite-dimensional linear equations system 1.6. Accuracy benchmarks for numerical solving the 3D electrostatic problems 1.7. More complicated examples of 3D field simulation 1.8 The cases of planar and axial symmetries 1.9 Calculation of potential and its derivatives near the boundary 1.10. Acceleration of field calculation. Finite-difference meshes and calculation domain decomposition 1.11. Microscopic and averaged fields of periodic structures Chapter 2. Surface charge singularities near irregular surface points 2.1. Two-faced conductive wedge in vacuum 2.2. Two-faced conductive wedge in the presence of dielectrics 2.3. The transfer matrix method 2.4. The case of pure dielectric vertex 2.5. Upper boundaries for the singularity index in 2D case 2.6. Variational approach to the spectral problem 2.7. Three-dimensional corners 2.8. Variational method in the case of dielectrics 2.9. Reduction to the 2D case 2.10. On-rib singularities near three-dimensional corner 2.11. The cases allowing separation of variables 2.12. Numerical solution of the Beltrami-Laplace spectral problem 2.13. Cubical and prism corners Chapter 3. Geometry perturbations 3.1. Integral variational equations and conjugate integral equation for the Green function 3.2. 3D perturbations in axisymmetric systems 3.3 Some examples of 3D perturb


Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


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Academic Press
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About the Authors

Dmitry Greenfield Author

Mikhael Monastyrskii Author