Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780123742209, 9780080880358

Advances in Imaging and Electron Physics, Volume 153

1st Edition

Aberration-corrected Electron Microscopy

Serial Editors: Peter Hawkes
Hardcover ISBN: 9780123742209
eBook ISBN: 9780080880358
Imprint: Academic Press
Published Date: 11th December 2008
Page Count: 590
Tax/VAT will be calculated at check-out
260.00
160.00
200.00
231.00
Unavailable
Compatible Not compatible
VitalSource PC, Mac, iPhone & iPad Amazon Kindle eReader
ePub & PDF Apple & PC desktop. Mobile devices (Apple & Android) Amazon Kindle eReader
Mobi Amazon Kindle eReader Anything else

Institutional Access


Table of Contents

History of aberration correction in electron microscopy (H. Rose) Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider) Aberration correction and STEM (O.L. Krivanek) First results using the Nion third order STEM corrector (P. Batson) STEM and EELS: Mapping materials atom by atom (A.B. Bleloch) Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (M. Hÿtch, F. Hüe, E. Snoeck and F. Houdellier) Novel aberration corrections concepts (B. Kabius) Aberration corrected imaging in CTEM and STEM (A. Kirkland, P.D. Nellist, Lan-Yun Chang and S.J. Haigh) Materials applications of aberration-corrected STEM (S.J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, K. van Benthem, A. Y. Borisevich, M. P. Oxley, W. Luo and S. T. Pantelides) Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka) Aberration correction in practice (K. Urban and J. Mayer) Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)


Description

History of aberration correction in electron microscopy (H. Rose) Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider) Aberration correction and STEM (O.L. Krivanek) First results using the Nion third order STEM corrector (P. Batson) STEM and EELS: Mapping materials atom by atom (A.B. Bleloch) Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (M. Hÿtch, F. Hüe, E. Snoeck and F. Houdellier) Novel aberration corrections concepts (B. Kabius) Aberration corrected imaging in CTEM and STEM (A. Kirkland, P.D. Nellist, Lan-Yun Chang and S.J. Haigh) Materials applications of aberration-corrected STEM (S.J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, K. van Benthem, A. Y. Borisevich, M. P. Oxley, W. Luo and S. T. Pantelides) Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka) Aberration correction in practice (K. Urban and J. Mayer) Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)

Key Features

  • First book on the subject of correctors
  • Well known contributors from academia and microscope manufacturers
  • Provides an ideal starting point for preparing funding proposals

Readership

All users of electron microscopes as well as physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


Details

No. of pages:
590
Language:
English
Copyright:
© Academic Press 2008
Published:
Imprint:
Academic Press
eBook ISBN:
9780080880358
Hardcover ISBN:
9780123742209

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France