Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

* Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

Complex-valued neural network and complex-valued BP, by Tohru Nitta 'Disorder', structured diffuse scattering and local crystal chemistry, by Ray L. Withers Nonlinear systems for image processing, by S. Morfu, P. Marquié, B. Nofiélé and D. Ginhac The Foldy-Wouthuysen transformation technique in optics, by Sameen Ahmed Khan Stack filters: from definition to design algorithms, by Nina Hirata Blind source separation: the sparsity revolution, by Jean-Luc Sparck, J. Bobin, Y. Moudden and M.J. Fadili

Details

No. of pages:
376
Language:
English
Copyright:
© 2008
Published:
Imprint:
Academic Press
Electronic ISBN:
9780080951560
Print ISBN:
9780123742193