Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key Features
- Includes grey systems and grey information
- Discusses Phase diversity
- Recent developments in the imaging of magnetic domains
- Explores stochastic deconvolution over groups
Readership
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Table of Contents
Grey systems and grey information
Y. Lin and S. Liu
Phase diversity
L. Mugnier, A. Blanc, and J. Idier
Recent developments in the imaging of magnetic domains
W. Szmaja
Stochastic deconvolution over groups
B. Yazici and C.E. Yarman
Product details
- No. of pages: 328
- Language: English
- Copyright: © Academic Press 2006
- Published: June 6, 2006
- Imprint: Academic Press
- eBook ISBN: 9780080462783
About the Author
Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and Expertise
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France
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