Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics

1st Edition - November 23, 2005

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  • Editor: Peter Hawkes
  • eBook ISBN: 9780080526249

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Description

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

  • DOGMA OF THE CONTINUUM AND THE CALCULUS OF FINITE DIFFERENCES IN QUANTUM PHYSICS (HARMUTH and MEFFERT)

    Chapter 1 - Introduction; Chapter 2 - Modified Klein-Gordon Equation; Chapter 3 - Inhomogeneous Difference Equation; Chapter 4 - Klein-Gordon Difference Equation for Small Distances; Chapter 5 - Difference Equation in Spherical Coordinates; Appendix

Product details

  • No. of pages: 352
  • Language: English
  • Copyright: © Academic Press 2005
  • Published: November 23, 2005
  • Imprint: Academic Press
  • eBook ISBN: 9780080526249

About the Serial Editor

Peter Hawkes

Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

About the Authors

Beate Meffert

Affiliations and Expertise

Humboldt University, Berlin, Germany

Henning Harmuth

Affiliations and Expertise

Retired, The Catholic University of America, Washington, DC, USA

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