Advances in Imaging and Electron Physics, Volume 126

1st Edition

Editors: Peter Hawkes Benjamin Kazan Tom Mulvey
Hardcover ISBN: 9780120147687
eBook ISBN: 9780080490069
Imprint: Academic Press
Published Date: 2nd May 2003
Page Count: 458
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Table of Contents

A Wavelet-Based Method for Mutlifractal Image Analysis: From Theoretical Concepts to Experimental Applications, An analysis of the Geometric Distortions Produced by Median and Related Image Processing Filters, Two-Photon Excitation Microscopy, Phase Closure Imaging, Three Dimensional Image Processing and Optical Scanning Holography, Nonlinear Image Processing using Artificial Neural Networks

Description

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading

Key Features

*Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics

*Emphasises theory and it's application in a practical sense

*Provides the FIRST full statement of a radical new approach to 'phase calibration' and the solution of this important and difficult problem, pioneered by A, Lannes

Readership

Researchers, academics, physicists and engineers working in the field of image and electron physics


Details

No. of pages:
458
Language:
English
Copyright:
© Academic Press 2003
Published:
Imprint:
Academic Press
eBook ISBN:
9780080490069
Hardcover ISBN:
9780120147687

Reviews

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading


About the Editors

Peter Hawkes Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also partic

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France

Benjamin Kazan Editor

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

Tom Mulvey Editor

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.