Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780120147663, 9780080490052

Advances in Imaging and Electron Physics, Volume 124

1st Edition

Authors: Peter Hawkes
Hardcover ISBN: 9780120147663
eBook ISBN: 9780080490052
Imprint: Academic Press
Published Date: 18th October 2002
Page Count: 400
Tax/VAT will be calculated at check-out
231.00
200.00
160.00
260.00
Unavailable
Compatible Not compatible
VitalSource PC, Mac, iPhone & iPad Amazon Kindle eReader
ePub & PDF Apple & PC desktop. Mobile devices (Apple & Android) Amazon Kindle eReader
Mobi Amazon Kindle eReader Anything else

Institutional Access


Table of Contents

  • Preface
  • Future Contributors
  • V-Vector Algebra and Volterra Filters
    • Publisher Summary
    • I INTRODUCTION
    • II VOLTERRA SERIES EXPANSIONS AND VOLTERRA FILTERS
    • III V-VECTOR ALGEBRA
    • IV V-VECTORS FOR VOLTERRA AND LINEAR MULTICHANNEL FILTERS
    • V A NOVEL GIVENS ROTATION–BASED FAST QR-RLS ALGORITHM
    • VI NONLINEAR PREDICTION AND CODING OF SPEECH AND AUDIO BY USING V-VECTOR ALGEBRA AND VOLTERRA FILTERS
    • VII SUMMARY
    • Appendix I THE GIVENS ROTATIONS
    • Appendix II SOME EFFICIENT FACTORIZATION ALGORITHMS
  • A Brief Walk Through Sampling Theory
    • I STARTING POINT
    • II ORTHOGONAL SAMPLING FORMULAS*
    • III CLASSICAL PALEY-WIENER SPACES REVISITED
    • IV SAMPLING STATIONARY STOCHASTIC PROCESSES
    • V AT THE END OF THE WALK
    • ACKNOWLEDGMENTS
  • Kriging Filters for Space–Time Interpolation
    • I INTRODUCTION
    • II DATA MODEL
    • III REVIEW OF KRIGING METHODS
    • IV BEST LINEAR UNBIASED PREDICTION
    • V COKRIGING FILTERS
    • VI SPACE–TIME KRIGING FILTERS
    • VII APPLICATIONS
    • VIII DISCUSSION AND CONCLUSION
    • APPENDIX: OPTIMALITY OF FILTERING ALGORITHMS
  • Constructions of Orthogonal and Biorthogonal Scaling Functions and Multiwavelets Using Fractal Interpolation Surfaces
    • I INTRODUCTION
    • II SCALING FUNCTION CONSTRUCTIONS
    • III ASSOCIATED MULTIWAVELETS
    • IV WAVELET CONSTRUCTIONS
    • V APPLICATIONS TO DIGITIZED IMAGES
    • APPENDIX
  • Diffraction Tomography for Turbid Media
    • I INTRODUCTION
    • II BACKGROUND
    • III DIFFRACTION TOMOGRAPHY FOR TURBID MEDIA: THE FORWARD MODEL
    • IV BACKPROPAGATION IN TURBID MEDIA
    • V SIGNAL-TO-NOISE RATIOS
    • VI CONCLUDING REMARKS
    • ACKNOWLEDGMENTS
  • Tree-Adapted Wavelet Shrinkage
    • I INTRODUCTION
    • II COMPARISON OF TAWS AND WIENER FILTERING
    • III WAVELET ANALYSIS
    • IV FUNDAMENTALS OF WAVELET-BASED DENOISING
    • V TREE-ADAPTED WAVELET SHRINKAGE
    • VI COMPARISON OF TAWS WITH OTHER TECHNIQUES
    • VII CONCLUSION
  • Index

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


Details

No. of pages:
400
Language:
English
Copyright:
© Academic Press 2003
Published:
Imprint:
Academic Press
eBook ISBN:
9780080490052
Hardcover ISBN:
9780120147663

About the Authors

Peter Hawkes Author

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the European and International congresses on (electron) microscopy. He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France