Advances in Imaging and Electron Physics
Aspects of Image Processing and Compression
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Readership
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Product details
- No. of pages: 327
- Language: English
- Copyright: © Academic Press 2001
- Published: October 11, 2001
- Imprint: Academic Press
- eBook ISBN: 9780080522234
About the Serial Editors
Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and Expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics
Benjamin Kazan
Affiliations and Expertise
Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey
Affiliations and Expertise
Aston University, Department of Electronic Engineering and Applied Physics, U.K.
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